Abstract
Epitaxial (Pb1-xLax)TiO3 (x = 0.00 ∼ 0.28) and Pb(ZryTi1-y)O3 (y = 0.00 ∼ 0.32) thin films were prepared by pulsed laser deposition and RF magnetron sputtering techniques, respectively, on MgO(001) single crystal substrates. The effect of transformation strain which was varied by the composition of the films, × or y, on the equilibrium ferroelectric domain structure were investigated systematically.
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