Abstract
The authors have developed the simultaneous measurement scheme for texture and phase fraction by using the Time-Of-Flight (TOF) neutron diffractometer, iMATERIA at J-PARC MLF, Japan. The Rietveld texture analysis (RTA) was applied for the data analysis method, which has been developed mainly at HIPPO diffractometer at LANSCE, USA. Because of the differences of measurement scheme and machine specifications, the analysis for the data from iMATERIA requires some special treatments. In this paper, we provide instructional information for the measurement at iMATERIA and subsequent RTA to determine the textures and phase fraction in metallic materials. The instrumental features and measurement procedures are firstly introduced. Second, some unique data treatments, especially about the technique called “scale factor bounding” is explained, including how to set it. We also suggest some refinement strategies especially aiming to have accurate phase fraction determination.
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