Abstract
The deposition characteristics of (Ba, Sr)TiO3 (BST) thin films using a liquid source metal-organic chemical vapor deposition on a 6-inch-diameter Pt/SiO2/Si wafer were investigated. Ba(DPM)2 tetraglyme, Sr(DPM)2 tetraglyme and Ti(DPM)2(O-i-Pr)2, dissolved in n-butyl acetate, were used as the sources of Ba, Sr and Ti, respectively. Step coverage, within-wafer uniformities in composition and thickness of the BST films were investigated as a function of substrate temperatures ranging from 420° C to 570° C. As the substrate temperature decreased, the step coverage improved, whereas the within-wafer uniformities degraded. From BST films deposited in a temperature range from 450° C to 480° C, good step coverage (>80%), as well as good within-wafer uniformity were obtained. However, in that temperature range, hazy deposition was observed due to many humps on the surface. The humps are an agglomeration of crystalline grains and are a few hundred Å in diameter, which have a Ti-rich composition compared to flat film region.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
