Demonstration of 10 keV-width K-edge Imaging Using an Energy-Discrimination X-ray Computed Tomography System Utilizing a Silicon-PIN Detector

Osahiko Hagiwara ,Akihiro Osawa ,Eiichi Satô ,Manabu Watanabe ,Hiroshi Miyata ,Jiro Nanao

doi:10.11318/mii.28.24

Demonstration of 10 keV-width K-edge Imaging Using an Energy-Discrimination X-ray Computed Tomography System Utilizing a Silicon-PIN Detector

Osahiko Hagiwara , Akihiro Osawa + Show 4 more

https://doi.org/10.11318/mii.28.24

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Journal: Medical Imaging and Information Sciences

Publication Date: Feb 25, 2011

Affiliation: Toho University, Iwate Medical University

#X-ray Computed Tomography System #Energy-Discrimination X-ray + Show 4 more

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Demonstration of 10 keV-width K-edge Imaging Using an Energy-Discrimination X-ray Computed Tomography System Utilizing a Silicon-PIN Detector

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