Abstract
High quality c axis oriented zinc oxide (ZnO) thin films have been deposited on glass substrates by low pressure, metal organic vapor deposition, using zinc acetate (Zn(CH 3COO) 2) and H 2O as source materials. Films have been characterized using X-ray diffraction, X-ray photoelectron spectroscopy, and Auger electron spectroscopy.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
