Abstract
A beamline for X-ray free electron laser (XFEL) has been developed at SACLA, SPring-8 Angstrom Compact free electron LAser. The beamline delivers and diagnoses an XFEL beam without degrading the beam quality. The transport optics are applicable in the range of 4–30 keV with a double-crystal monochromator or 4–15 keV with either of two double-mirror systems. A photon diagnostic system of the beamline monitors intensity, photon energy, center-of-mass position, and spatial profile in shot-by-shot and non-destructive manners.
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