Application of stochastic programming method for analysis of semiconductor noise signal generators

Abstract

In this work it is proposed to use the method of stochastic programming to obtain the values of key parameters of electronic components of electrical circuits, which are used to prevent leakage of confidential information due to electromagnetic radiation. The essence of the application of this method is to determine the optimal value of the power of the output noise-like signal generated by the noise generator, which provides the highest quality of interference aimed at suppressing a dangerous signal, the leakage of which is possible due to the side electromagnetic radiation at the object of information activity. The purpose of the article is to determine the condition of optimal generation of noise-like signals of semiconductor elements with specified characteristics and to optimize the maximum output power of the noise signal. Results: The article shows the use of linear and stochastic programming methods to estimate the required parameters of the noise generator by the criterion of the maximum output power of the noise signal at the load resistance. Conclusions: the conducted stochastic optimization showed the relationship of the output random variable from the initial conditions imposed on the semiconductor element, and allowed to obtain fixed optimal values of the load resistance parameters for a given optimization criterion. If we impose an additional condition of a given accuracy on the solution of this problem, we can significantly improve the quality of control of the parameters of the noise semiconductor element. Further research can be directed to determine the distribution of a random noise signal at the output of the device to counteract information leakage through the channel of side electromagnetic radiation and interference, that is, at the output of the power amplifier of the generator-jammer, to which the antenna is connected.