Abstract
The annealing temperature impact on the internal strain and the ferroelectric properties of Bi3.25La0.75Ti3O12 thin films was studied. It is found that, with the annealing temperature increasing, the internal strain in films first decreases (below 720°C) and then increases (at 750°C), while the volume fraction of a-axis-oriented grains, the remnant polarization and the coercive field first increase (below 720°C) and then decrease (at 750°C). These experimental results show that the properties of the Bi3.25La0.75Ti3O12 thin films can be directly influenced by the annealing temperature.
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