Abstract
A new phenomenon involving the entire saturation of unilateral tails of buried channel charge-coupled devices (BCCDs) under laser radiation is observed in this study. A physical model related to this phenomenon is constructed based on the assumption that the charge transfer inefficiency of BCCD is a jump function of signal charge quantity. The profile of a spot tail under laser radiation is simulated using this self-developed model. The simulation results are compared with experimental findings to validate this model.
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