Abstract

Preliminary results are presented for a 3-terminal device fabricated by incorporating a narrow quantum well into the collector barrier of a unipolar hot electron transistor. The structure allows unique studies of the mechanism of resonant tunneling in which the carrier injection energy and the bias across the double barrier can be independently varied. The transistor clearly shows an additional current collection threshold representing as much as 10% of the injected current attributable to tunneling via the single subband in the quantum well. This interpretation is confirmed by measurements in perpendicular and parallel magnetic fields despite the fact that theoretical estimates of the resonant tunneling current without scattering are many orders of magnitude smaller, and there are strong indications that elastic scattering in the well is responsible for the enormous discrepancy. The data tend to support proposals (Guéret, 1989a, 1989b; Wolak, 1988) that elastic scattering is responsible for the large valley currents in resonant tunneling diodes, and it appears that the tunnel process may not be completely incoherent as has frequently been assumed up to now.

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