Abstract
We have developed and tested a crystal-optic X-ray fluorescence analyzer, which combines the features of electron-volt energy resolution, large solid angle coverage, and a demonstrated tunability over a photon-energy range from ca. 6.5 to 12 keV. It is based upon the principle of active optics to precisely adjust the shape of a strip of silicon. Although the primary use of the device is in high resolution X-ray spectroscopy, it can also be used for imaging. We present the basic design and two illustrative applications in atomic physics and trace-element analysis.
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