Abstract
A crystal-optic x-ray fluorescence analyzer has been designed and tested, which combines the features of electron-Volt energy resolution, large solid angle coverage, and tunability over several thousand electron-Volts. Dependent on experimental requirements the crystal shape can be chosen within the elasticity limits of the crystal. This allows the use of the device not only for high resolution X-ray spectroscopy, but also for imaging purposes. We present the basic design, a self-alignment algorithm, and a basic discussion about the principal feasibilities and limitations of this concept. Additionally, first experimental results on ultra dilute systems and other applications will be presented.
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