Abstract
A crystal-optic x-ray fluorescence analyzer has been designed and tested, which combines the features of electron-Volt energy resolution, large solid angle coverage, and tunability over several thousand electron-Volts. Dependent on experimental requirements the crystal shape can be chosen within the elasticity limits of the crystal. This allows the use of the device not only for high resolution X-ray spectroscopy, but also for imaging purposes. We present the basic design, a self-alignment algorithm, and a basic discussion about the principal feasibilities and limitations of this concept. Additionally, first experimental results on ultra dilute systems and other applications will be presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
