Abstract
A new M-testability approach is introduced. M-testability is based on the variable testability measure (VTM), developed for data-path test prediction in high-level synthesis. For particular forms of arrays (iterative logic arrays of identical cells), the C-testability concept is appropriate to evaluate their testability using a one-faulty cell model. This concept is extended to M-testability to deal with more general arrays (of nonidentical cells or functional primitives in datapaths). The elaboration of the M-testability concept leads to the development of a classified-level approach. Some data-path examples are treated to show the practical application of the proposed technique in high-level synthesis. >
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