M-testability: an approach for data-path testability evaluation

Abstract

In this paper, a new M-testability approach is introduced. M-testability is based on a new Variable Testability Measure (VTM) appropriate in high-level synthesis. It is shown that VTM is a generalization of the C-testability concept which is extended to M-testability to deal with more general arrays such as those of non identical cells or functional primitives in data paths. The elaboration of this concept led to the development of a classified-level approach applied to the data path primitives. Some examples are given to show the practical applicability of the proposed technique in high-level synthesis. >