Abstract
The variation in optical reflectance during growth was investigated in situ for Co/Cu and Co/Au multilayers prepared in a molecular beam epitaxy (MBE) chamber, while the specular RHEED (reflection high energy electron diffraction) intensity was simultaneously monitored. The experimental reflectance data were found to agree well with the prediction of a numerical simulation. The final reflectance and the effective optical constants of the films are affected by the modulation of the multilayer structures. The RHEED data indicated different growth behaviors for Cu and Au and an unexpected drop in reflectance for the initial deposition of Cu on Co layers was confirmed. A similar effect was observed for the growth of Au on Co.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
