Abstract
The variation in optical reflectance during growth was investigated in situ for Co/Cu multilayers prepared in a molecular beam epitaxy (MBE) chamber, whilst the RHEED intensity was simultaneously monitored. The effect on the growth of the addition of a small amount of Pb impurity was studied. The unexpected drop in reflectance for the initial growth of Cu on Co in a multilayer with one monolayer of Pb remained but disappeared after a higher coverage of Pb was introduced. In the case of the higher Pb coverage, RHEED results confirmed that a substantial amount of Pb remained at the surface during, and after, multilayer growth.
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