Abstract
This chapter explains the process of image formation in STEM (Scanning transmission electron microscope). STEM phenomenon can be easily understood by considering the corresponding TEM (transmission electron microscope) situation. In STEM, the wave incident on the specimen is not plane, as it is in the normal imaging modes. Instead, the source and specimen planes are conjugated and the probe-forming lens operates at a high demagnification. STEM divides the bright-field detection area into zones and forms a weighted sum of the signals, for a dominant phase component. More recently, it has been pointed out that any desired configuration could be generated by reading the image from pixel into computer memory and multiplying it by the appropriate pattern of zeros and ones (or weights), and then adding the result and storing it.
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