The photon-induced K X-ray fluorescence cross-sections ( σ K α , σ K β ) for Ti, V and Cr in halogens (F and Cl) compounds were investigated. Measurements were carried out at 10 different energies in the interval 5.5– 12.1 keV by using secondary excitation method. K X-rays emitted by samples were counted by a Si(Li) detector with resolution 160 eV at 5.9 keV . Obtained values were compared with the theoretical values of pure elements.