Information about systematic investigations of quaternary intermetallic systems with rare-earth elements is scarce, therefore studies of such systems are relevant. Alloys of the Tb‒Hf‒Al‒Si system are promising for the creation of new functional materials thanks to their mechanical (due to the presence of Al in the samples), heat-resistant (Hf), semiconductor (Si), magnetic, superconducting, catalytic, and sorption (Tb) properties. The aim of this work was to investigate the Tb‒Hf‒Al‒Si system: establish the phase composition of alloys, search for new phases and determine their crystal structures. Samples of the Tb‒Hf‒Al‒Si system were prepared by arc-melting the elements under a purified argon atmosphere. The alloys were annealed at 600 °C for 7 months in evacuated quartz ampoules, and subsequently quenched in cold water. X-ray powder diffraction data were recorded on a DRON 2.0M diffractometer, Fe K α radiation, a Panalytical X’Pert, Cu K α radiation, and a STOE Stadi P diffractometer, Cu K α 1 radiation. Energy-dispersive X-ray analyses were performed on a Tescan Vega 3 LMU scanning electron microscope. During the investigation of the Tb‒Hf‒Al‒Si system the formation of the quaternary phase (Tb 0.74 Hf 0.26 )(Al 0.48 Si 0.52 ) was established based on X-ray diffraction and energy-dispersive X-ray analysis. The crystal structure of this phase belongs to the TlI type (Pearson symbol oS 8, space group Cmcm , unit cell parameters: а = 4.312(1), b = 10.793(3), c = 3.973(1) Å) with a statistical mixture of Tb and Hf atoms on the I site and a statistical mixture of Al and Si atoms on the Tl site. Based on the results obtained here, the existence in the quaternary system Tb‒Hf‒Al‒Si of extended solid solutions based on other binary, Hf 5 Si 3 (structure type Mn 5 Si 3 , Pearson symbol hP 16, space group P 6 3 / mcm , 10 at. % Tb and 7 at. % Al – (Tb 0.1 6 Hf 0.8 4 ) 5 (Al 0.1 9 Si 0.8 1 ) 3 ), TbAl 2 (MgCu 2 , cF 24, Fd -3 m , 7 at. % Si – (Tb 0 . 94 Hf 0 . 06 )(Al 0 . 90 Si 0 . 10 ) 2 ), TbAl (DyAl, oP 16, Pbcm , 8 at. % Hf and 5 at. % Si – (Tb 0 . 85 Hf 0 . 15 )(Al 0 . 89 Si 0 . 11 )), HfSi (FeB, oP 8, Pnma , 9 at. % Tb and 7 at.% Al – (Tb 0 . 17 Hf 0 . 83 )(Al 0 . 15 Si 0 . 85 )), and ternary, Tb 2 Hf 3 Si 4 (Sc 2 Re 3 Si 4 , tP 36, P 4 1 2 1 2, 18 at. % Al – (Tb 2 . 4 Hf 2 . 6 (Al 0 . 42 Si 0 . 58 ) 4 ), compounds was established. Within the homogeneity ranges of the solid solutions, the value of the valence electron concentration does practically not change. Keywords : Tb‒Hf‒Al‒Si system, X-ray diffraction, energy-dispersive X-ray analysis, solid solution, TlI structure type.
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