Journal Article Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways Get access Xiahan Sang, Xiahan Sang Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNInstitute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Andrew R Lupini, Andrew R Lupini Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNMaterials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Raymond R Unocic, Raymond R Unocic Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNInstitute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Tricia L Meyer, Tricia L Meyer Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Thomas Z Ward, Thomas Z Ward Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Ho Nyung Lee, Ho Nyung Lee Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Eirik Endeve, Eirik Endeve Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNComputer Science and Mathematics, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Richard K Archibald, Richard K Archibald Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNComputer Science and Mathematics, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Albina Y Borisevich, Albina Y Borisevich Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNMaterials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Sergei V Kalinin, Sergei V Kalinin Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNInstitute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar ... Show more Stephen Jesse Stephen Jesse Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNInstitute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 900–901, https://doi.org/10.1017/S1431927616005341 Published: 25 July 2016