Topological order of magnetic films shows promise due to its unconventional electromagnetic transport effects, but the discontinuity and the miniaturization of patterned magnetic films impose a limit on research of topological properties. In this article, a technique is proposed, the application of which improves the ease of electrical measurement in sub-micrometer-sized magnetic thin film elements. To obtain the topological Hall resistivity of the discretized magnetic textures, a ferromagnetic bilayer film was fabricated into specific geometries. Micromagnetic simulations are presented that demonstrate the topological spin distribution in an exchange coupled patterned ferromagnetic film. Experiments are performed on FePt/FeNi bilayered films that are formed with square arrays of FeNi disks on top of a continuous FePt film in a topological spin distribution. The observation of topological Hall effect was made in the FePt/FeNi film without a nanoscale Hall-bar device. The technique presented facilitates the electrical property measurement even in nanometer elements and offers a pathway for promoting spintronics applications.
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