Concept Of Testability Research Articles

Quantum logics seen as quantum testability theories

We confute logical relativism and forward an alternative epistemological thesis according to which nonstandard “truth-theories” are considered theories of some metalinguistic concepts which do not coincide with truth, this latter concept being exhaustively described by Tarski's truth theory. We illustrate our viewpoint by showing that quantum logics can be interpreted as quantum physical theories of the metalinguistic concept of testability in the framework of a suitable classical language (with Tarskian semantics).

Truth versus testability in Quantum Logic

We forward an epistemological perspective regarding non-classical logics which restores the universality of logic in accordance with the thesis of “global pluralism”. In this perspective every non-classical “truth-theory” is actually a theory of some metalinguistic concept which does not coincide with the concept of truth (described by Tarski's truth theory). We intend to apply this point of view to Quantum Logic (QL) in order to prove that its structure properties derive from properties of the metalinguistic concept of testability in Quantum Physics. To this end we construct a classical language Lcand endow it with a classical effective interpretation which is partially inspired by the Ludwig approach to the foundations of Quantum Mechanics. Then we select two subsets of formulas in Lcwhich can be considered testable because of their interpretation and we show that these subsets have the structure properties of Quantum Logics because of Quantum Mechanical axioms, as desired. Finally we comment on some relevant consequences of our approach (in particular, the fact that no non-classical logic is strictly needed in Quantum Physics).

Testability of software components

The concept of domain testability of software is defined by applying the concepts of observability and controllability to software. It is shown that a domain-testable program does not exhibit any input-output inconsistencies and supports small test sets in which test outputs are easily understood. Metrics that can be used to assess the level of effort required in order to modify a program so that it is domain-testable are discussed. Assessing testability from program specifications and an experiment which shows that it takes less time to build and test a program developed from a domain-testable specification than a similar program developed from a nondomain-testable specification are also discussed. >

Multi-Infarct Dementia: A Reappraisal

Multi-infarct dementia (MID) may not be the only or even the most important form of vascular dementia. Vascular factors probably contribute to dementia through cerebral infarcts and white matter changes more often than they cause it. More subtle ischemic insults affecting synapses, cells, or protein synthesis without causing frank infarction remain plausible but unproven postulates. Lest we regress to vague and comforting notions of silting blood vessels and ailing neurons, let us recognize that although MID may not explain all of vascular dementia, it has the virtue of being a firm, testable concept. As such it has not been overthrown or even seriously challenged. But it is time for a reappraisal.

Design for testability for future digital avionics systems

The authors describe an integrated testing approach called the Maintenance and Diagnostic System (MADS), which was developed for digital avionics systems using VHSIC and semicustom devices. Mission/operational requirements dictate high availability with capability to detect 98% of all faults and isolate 90% of these faults to a line replacement module (LRM) or 95% of the faults to two LRMs. MADS achieves these goals by defining a module maintenance node (MMN) chip set for each LRM in the system and the design for testability concepts for hardware. The MMN aids parallel, high-speed testing of LRMs, isolating the fault(s) to a module/chip level while incurring less than 10% overhead. It uses the concepts of scan set design, pseudorandom test vector generation, output response compression, and separate scan set loops to test the SSI-MSI logic on the LRM. It also stores interim test results and run-time fault information to isolate the hard-to-reproduce failures and performs verification of interchip and intermodule wiring.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

A reliable 1-Mbit DRAM with a multi-bit-test mode

A single 50V supply 1-Mb DRAM using a half V/SUB cc/ biased memory cell with a reduced electric field of 2 MV/cm and a shared sensing scheme for reasonable cell signal is described. A testability concept which allows 1/4 reduced test time, page/nibble functions including a continuous nibble mode, and an effective redundancy circuit are also described. A typical access time of 90 ns has been obtained using a titanium polycide world-line technology.

Simulation of intrinsic bursting in CA3 hippocampal neurons

Dendritic recordings from hippocampal pyramidal cells suggest that bursts of action potentials—riding on a depolarizing wave and terminating in a slow calcium-mediated spike—can be generated locally in the dendrites, as well as at the soma. These data necessitated revision of our earlier model in which bursts at the soma are generated by interaction of two spatially separated conductance systems—a fast-spike sodium mechanism at the soma and a slow-spike calcium mechanism on the apical dendrite. We have introduced into a model of the CA3 hippocampal neuron two experimentally testable concepts: voltage-dependent inactivation of I k and partial inactivation of I Ca by Ca 2+ ion. With these mechanisms, the model accurately reproduces bursts generated in either soma or in the apical dendrites by sets of conductances all located in the same respective membrane region. The model is also capable of bursting repetitively in response to continuous stimulation.

Design of easily testable bit-sliced systems

Bit-sliced systems are formed by interconnecting identical slices or cells to form a one-dimensional iterative logic array (ILA). This paper presents several design techniques for constructing easily testable bit-sliced systems. Properties of ILA's that simplify their testing are examined. C-testable ILA's, which require a constant number of test patterns independent of the array size, are characterized, and a method for making an arbitrary ILA C-testable is presented. A new testability concept for arrays called I-testability is introduced. I-testability ensures that identical test responses can be obtained from every cell in an ILA, and thus simplifies response verification. I-testable ILA's are characterized, as well as Cl-testable arrays, which are simultaneously C- and I-testable. A method of making an arbitrary ILA Cl-testable is presented. The application of C- and I-testing to the design of bit-sliced (micro-) computers is investigated. For this purpose a family of easily testable processor slices is described. The design of a self-testing CPU based on I-testing is discussed, and compared with a more conventional self-testing design.

Design of Easily Testable Bit-Sliced Systems

Bit-sliced systems are formed by interconnecting identical slices or cells to form a one-dimensional iterative logic array (ILA). This paper presents several design techniques for constructing easily testable bit-sliced systems. Properties of ILA's that simplify their testing are examined. C-testable ILA's, which require a constant number of test patterns independent of the array size, are characterized, and a method for making an arbitrary ILA C-testable is presented. A new testability concept for arrays called I-testability is introduced. I-testability ensures that identical test responses can be obtained from every cell in an ILA, and thus simplifies response verification. I-testable ILA's are characterized, as well as CI-testable arrays, which are simultaneously C- and I-testable. A method of making an arbitrary ILA CI-testable is presented. The application of C- and I-testing to the design of bit-sliced (micro-) computers is investigated. For this purpose a family of easily testable processor slices is described. The design of a self-testing CPU based on I-testing is discussed, and compared with a more conventional self-testing design.

On a question of McNaughton and Papert

In a recent book, McNaughton and Papert asked under what conditions a free submonoid of a free monoid is locally testable. The answer to this question is given here. The solution relates the concept of local testability with that of synchronization in a code and the algebraic notion of conjugacy in a monoid. The finiteness of the basis (or code) which generates the free submonoid plays an essential role in our result.

Price Signal Refraction in Pork Processing

AbstractA method of measuring pricing efficiency in objective, quantitative terms is presented. “Evaluation of pricing efficiency” has long been the terminology used in studies of pricing accuracy. The term “price signal refraction” as used here refers to the more specific, quantifiable, and testable concept dealt with in this article. The distortion of price signals passing through one or more levels of the market is analogous to the refraction of light rays. This study evaluated price refraction at one level of the pork market. Regression models were fitted to the individual carcass data from a sample of 300 carcasses. The data were subjected to objective statistical test. The findings indicated that price refraction attributable to weight was small and insignificant but refraction attributable to backfat was large and significant.

Class Analysis: What Class is Not

HE TERM has assumed an importance in contemporary theory in inverse proportion to its clarity as a scientific instrument for investigation of the phenomena with which it purports to deal. Every science advances by defining and sharpening its concepts and testing them with the external reality they attempt to describe, but the concept of has not been rigorously defined and is not tested. There is such confusion in the term that it is impossible to use it for investigation. This confusion has resulted in part from attempts to make the concept mean too much at once, and thus too little in the long run. It is made to mean too much because it is used to explain too many discrete and different things, and it is made to mean too little because, being used to refer to so many different things, it gives no clear explanation of any of them. The scientific validity of theory, like that of all theory, lies in its verifiability through empirical research. Systematization of theory for pedagogical or other presentative purposes often leads to a worship of theory in itself. This is nowhere so evident as in the theory of All sorts of definitions are given, theoretical analyses are drawn up,-and nobody employs them. The lack of research in the field of analysis is due, not to lack of interest or internal significance, but to the inadequacy of present theoretical foundations to set the stage for investigation. Empirical analyses (historical and field research) are not made because the theoretical apparatus with which we are asked to work gives no clues to the recognition of pertinent data and, a fortiori, no means for handling data.' To clear the ground for testable concepts and categories, we must first consider some common theories which recently have been presented but never have been tested. They suffer from what may be called a sociologism which refines concepts and rarefies theory to the point where it recognizes no need for verification. The discovery of the shortcomings of such theories will aid us in formulating a theory and a concept capable of empirical use. I. Class Is not Class. This confusion of the substantive with a qualification of itself is the fundamental error in all contemporary sociological theory concerning There is in society, it is argued, a reality which may be termed social class. T. H. Marshall2 distinguishes social class from class, which latter he takes in the Marxian sense. Social