Test Generation For Sequential Circuits Research Articles

One More Class of Sequential Circuits having Combinational Test Generation Complexity

The paper uses the concept of time expansion model to find the test generation for acyclic sequential circuits. Any acyclic sequential circuit without hold registers can be tested with combinational test generation complexity using this model. We show that for acyclic sequential circuits having hold registers, a subset of such circuits can also be tested with this complexity. We define the max-testable class of sequential circuits that includes both these groups. The paper also suggests an algorithm to find such class of circuits.

Fuzzy delay model based fault simulator for crosstalk delay fault test generation in asynchronous sequential circuits

In this paper, a fuzzy delay model based crosstalk delay fault simulator is proposed. As design trends move towards nanometer technologies, more number of new parameters affects the delay of the component. Fuzzy delay models are ideal for modelling the uncertainty found in the design and manufacturing steps. The fault simulator based on fuzzy delay detects unstable states, oscillations and non-confluence of settling states in asynchronous sequential circuits. The fuzzy delay model based fault simulator is used to validate the test patterns produced by Elitist Non-dominated sorting Genetic Algorithm (ENGA) based test generator, for detecting crosstalk delay faults in asynchronous sequential circuits. The multi-objective genetic algorithm, ENGA targets two objectives of maximizing fault coverage and minimizing number of transitions. Experimental results are tabulated for SIS benchmark circuits for three gate delay models, namely unit delay model, rise/fall delay model and fuzzy delay model. Experimental results indicate that test validation using fuzzy delay model is more accurate than unit delay model and rise/fall delay model.

Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints

The paper proposes a hierarchical untestable stuck-at fault identification method for non-scan synchronous sequential circuits. The method is based on deriving, minimizing and solving test path constraints for modules embedded into Register-Transfer Level (RTL) designs. First, an RTL test pattern generator is applied in order to extract the set of all possible test path constraints for a module under test. Then, the constraints are minimized using an SMT solver Z3 and a logic minimization tool ESPRESSO. Finally, a constraint-driven deterministic test pattern generator is run providing hierarchical test generation and untestability proof in sequential circuits. We show by experiments that the method is capable of quickly proving a large number of untestable faults obtaining higher fault efficiency than achievable by a state-of-the-art commercial ATPG. As a side effect, our study shows that traditional bottom-up test generation based on symbolic test environment generation at RTL is too optimistic due to the fact that propagation constraints are ignored.

An Investigation of Possibilities of Improving Random Test Generation for Non-scan Sequential Circuits

High-performance circuits with aggressive timing constraints are usually very susceptible to delay faults. The latest research shows that functional tests designed using random test generation exhibit good transition fault coverages. In the paper, we investigated the possibilities of improving random test generation for at-speed testing of non-scan synchronous sequential circuits. Based on research of distribution of "1" in randomly generated test pattern we suggested guidance for management of test generation process. The implementation of semi deterministic algorithms showed that the optimisation of separate steps by construction of test subsequences doesn't improve the final outcome. Ill. 2, bibl. 8, tabl. 3 (in English; abstracts in English and Lithuanian).http://dx.doi.org/10.5755/j01.eee.114.8.685

Functional fault models for non-scan sequential circuits

The paper presents two functional fault models that are applied for functional delay test generation for non-scan synchronous sequential circuits: the pin pair state (PPS) fault model and the pin pair full state (PPFS) fault model. The PPS fault model deals with the pairs of stuck-at faults on the primary inputs and the primary outputs, as well as, with the pairs of stuck-at faults on the previous state bits and the primary outputs. The PPFS fault model encompasses the PPS model, and additionally deals with the pairs of stuck-at faults on the primary inputs and the next state bits, as well as, with the pairs of stuck-at faults on the previous state bits and the next state bits. The main factor in assessing the quality of obtained test sequences was the transition fault coverage at the gate level of the selected according to the appropriate fault model test sequences from the generated randomly ones. The experimental results demonstrate that the implementation using presented functional fault models allow selecting the test sequences from the initial test set without the loss of transition fault coverage in many cases, and the number of the selected test sequences is much lesser than that of the initial test set. This result demonstrates that the functional delay test can be generated using the presented functional delay fault models before structural synthesis of the circuit.

GENERATING FUNCTIONAL DELAY FAULT TESTS FOR NON-SCAN SEQUENTIAL CIRCUITS

The paper presents two functional fault models that are devoted for functional delay test generation for non-scan synchronous sequential circuits. These fault models form one joint functional fault model. The non-scan sequential circuit is represented as the iterative logic array model consisting of k copies of the combinational logic of the circuit. The value k defines the length of clock sequence. The length of clock sequence is determined using the presented functional fault models. The experimental results demonstrate the superiority of the delay test patterns generated at the functional level using the introduced functional fault models against the transition test patterns obtained at the gate level by deterministic test pattern generator. The functional delay test generation method especially is useful for the circuits, when the long test sequences are needed in order to detect transition faults.

Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on k-Notation

In this paper, we discuss the relationship between the test generation complexity for path delay faults (PDFs) and that for stuck-at faults (SAFs) in combinational and sequential circuits using the recently introduced τk-notation. On the other hand, we also introduce a class of cyclic sequential circuits that are easily testable, namely two-column distributive state-shiftable finite state machine realizations (2CD-SSFSM). Then, we discuss the relevant conjectures and unsolved problems related to the test generation for sequential circuits with PDFs under different clock schemes and test generation models.

Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability

In this paper, we propose a method of accelerating test generation for sequential circuits by using the knowledge about the availability of state justification sequences, the bound on the length of state distinguishing sequences, differentiation between valid and invalid states, and the existence of a reset state. We also propose a method of synthesis for testability (SfT) which takes the features of our test generation method into consideration to synthesize sequential circuits from given FSM descriptions. The SfT method guarantees that the test generator will be able to find a state distinguishing sequence. The proposed method extracts the state justification sequence from the FSM produced by the synthesizer to improve the performance of its test generation process. Experimental results show that the proposed method can achieve 100% fault efficiency in relatively short test generation time.

Nonscan design for testability for synchronous sequential circuits based on conflict resolution

A testability measure called conflict, based on conflict analysis in the process of sequential circuit test generation is introduced to guide nonscan design for testability. The testability measure indicates the number of potential conflicts to occur or the number of clock cycles required to detect a fault. A new testability structure is proposed to insert control points by switching the extra inputs to primary inputs, using whichever extra inputs of all control points can be controlled by independent signals. The proposed design for testability approach is economical in delay, area, and pin overheads. The nonscan design for testability method based on the conflict measure can reduce many potential backtracks and make many hard-to-detect faults easy-to-detect; therefore, it can enhance actual testability of the circuit greatly. Extensive experimental results are presented to demonstrate the effectiveness of the method.

Test generation for sequential circuits using state transition diagram and test generation for combinatorial circuit part

AbstractThis study deals with single stuck‐at faults in sequential circuits; in particular, a test generation method featuring low generation complexity and short test sequences. With the proposed method, short test sequences are generated using shortest local connections between activation vector set found for combinatorial circuit part at gate level, and state transitions found from state transition diagram at functional level. Generated test sequences are input sequences composed of subsequences referred to as single test sequences. Single test sequences are composed of state control sequences that control activation vectors and their states, and UIO (Unique Input/Output) sequences that confirm states after applying activation vectors. Test sequences are generated so as to locally minimize total length of state control sequences and UIO sequences in connected single test sequences, which results in shorter test sequences as compared to previous generation methods. Evaluation experiments using MCNC benchmarks proved that test sequences generated by the proposed method were shorter by up to 28.8% as compared to previous methods while fault coverage was above 98% on the average. © 2001 Scripta Technica, Electron Comm Jpn Pt 2, 84(8): 20–28, 2001

Identification of primitive faults in combinational and sequential circuits

This paper presents a method of primitive fault identification and test generation for combinational and nonscan sequential circuits. It uses the concept of sensitizing cubes to obtain input vectors that statically sensitize primitive faults in combinational circuits. The same technique is used to identify combinationally primitive faults in the next-state and output logic of sequential circuits. Such faults are primitive if and only if the fault effects on paths to state variable flip-flops can be propagated to a primary output (PO). Test sequences, including initializing sequences from a reset state and sequences that propagate fault effects from flip-flops to POs, are generated for primitive faults, wherever possible. The proposed method has been implemented and used to derive tests for primitive faults in the ISCAS'89 and MCNC'91 benchmark circuits. It was able to find all primitive faults and also obtain robust tests for a large fraction of them when the circuits were treated as combinational. When the same circuits were treated as nonscan sequential circuits, all primitive faults could not be found because fault propagation had to be limited to a relatively small number of time frames.

Sequential Circuit Test Generation Using a Symbolic/Genetic Hybrid Approach

Symbolic and genetic techniques are combined in a new approach to sequential circuit test generation that uses circuit decomposition, rather than the algorithmic decomposition used in previous hybrid test generators. Symbolic techniques are used to generate test sequences for the control logic, and genetic algorithms are used to generate sequences for the datapath. The combined sequences provide higher fault coverages than those generated by existing deterministic and GA-based test generators, and execution times are significantly lower in many cases.

Dynamic state traversal for sequential circuit test generation

A new method for state justification is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is used to guide the search during state justification. State-transfer sequences that drive the circuit from the current state to the target state may already be known. Otherwise, genetic engineering of existing state-transfer sequences is required. In both cases, genetic-algorithm-based techniques are used to generate valid state justification sequences for the circuit in the presence of the target fault. This approach achieves extremely high fault coverages, and thus outperforms previous deterministic and simulation-based techniques.

Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits

Partial reset has been shown to have significant impact on test generation for sequential circuits in a stored-pattern test application environment. In this paper, we explore the use of partial reset in fault-independent testing and built-in self-test (BIST) of non-scan sequential circuits. We select a subset of flip-flops in the circuit to be resetable to logic one or zero during the application of the test vectors. The resetting is performed with random frequency. The selection of the flip-flops and the reset polarity is based on fault-propagation analysis, which determines the impact of a selected flip-flop on fault propagation from the circuits structure. Application of partial reset as described above yields an average improvement of 15% in fault-coverage for sequential circuits resistant to random pattern testing. To further enhance testability, we also present a methodology for selecting observable test points based on propagation of switching activity. Overall, high fault coverages (about 97%) are obtained for many of the ISCAS89 benchmark circuits. Thus, partial reset BIST provides a low cost alternative for testing sequential circuits when scan design is unacceptable due to area and/or delay constraints. The routing overhead for implementing BIST is seen to be about 6%.

Compact test generation for full scan sequential circuits using multiple frame vectors

A new test set compaction method that uses multiple frame vectors to test fully scanned sequential circuits is proposed. The FAN algorithm is extended to generate compact multiple frame test vectors. The proposed method generates the smallest test sets among all recognised full scan test set compaction algorithms.

Sequential test generators: past, present and future

With the growth in complexity of very large scale integration (VLSI) circuits, test generation for sequential circuits is becoming increasingly difficult and time consuming. Even though the computing power and resources have multiplied dramatically over last few decades, an increasing number of memory elements in VLSI circuits require more effective and powerful sequential test generators. In this paper, we describe and illustrate the working of existing sequential circuit test generation algorithms for the VLSI circuits. We also categorize all sequential testing algorithms, and summarize their relative advantages and disadvantages. The research issues and future directions in the sequential circuit testing area are also discussed.

Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG

New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing sequences are used to propagate the fault effects from the flip-flops to the primary outputs by distinguishing the faulty machine state from the fault-free machine state. Set, clear, and pseudoregister justification sequences are used for state justification via a combination of partial state justification solutions. Reengineering of existing finite-state machine sequences may be needed for specific target faults. Moreover, conflicts imposed by the use of multiple sequences may need to be resolved. Genetic-algorithm-based techniques are used to perform these tasks. Very high fault coverages have been obtained as a result of this technique.

Fast fault translation

Test generator algorithms may be classified by the level of circuit description they utilize. Algorithms based on a logic-gate level description of the circuit under test (CUT) are the most common. Functional algorithms utilize a functional description of the CUT. Functional test generation techniques may provide better defect coverages than do purely logic-level techniques. Multilevel test generation algorithms attempt to realize the advantages of both approaches by utilizing fault translation. Here, gate-level faults are translated to functional faults and test generation is performed at the functional level. In this paper, we develop and present new techniques for fast efficient fault translation from the logic to the functional level. These techniques are implemented in a multilevel sequential circuit test generation system. The performance of the system is investigated on benchmark circuits.

Deriving logic systems for path delay test generation

We present an algorithm to derive logic systems for various classes of path delay test problems. In these logic systems, the value of a signal represents the relevant conditions that occur during a set of consecutively applied vectors. Starting from a set of basic values for valid signals at primary inputs, a state transition graph is constructed to enumerate all possible signal states relevant to path activation that are reachable by Boolean operations. These states include all incompletely specified states, composed as combinations of basic values. A distinguishability analysis then finds all state-pairs that need to be distinguished during test generation. The final step minimizes the number of states. For forward and backward implications of test generation in combinational or sequential circuits, the procedure provides optimal logic systems. We define optimality as the smallest set of logic states that provides the least possible ambiguity in implications. Thus, an optimal set of logic states will minimize the number of backtracks in test generation. A 10-valued logic described in the literature is found to be optimal for generating tests for single path delay faults. Other problems addressed in this paper include compact test generation through activation of many single path delay faults, test generation for rated-clock test application, and test generation for multiple path delay faults. The limitations and capabilities of various logic systems are illustrated by examples.

A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation

We present a new approach to automatic test pattern generation for very large scale integrated sequential circuit testing. This approach is more efficient than past test generation methods, since it exploits knowledge of potential circuit defects. Our method motivates a new combinatorial optimization problem, the Tour Covering Problem. We develop heuristics to solve this optimization problem, then apply these heuristics as new test generation procedures. An empirical study comparing our heuristics to existing methods demonstrates the superiority of our approach, since our approach decreases the number of input vectors required for the test, translating into a reduction in the time and money required for testing sequential circuits.