Test Circuit Research Articles

A Programmable Gate Driver Module-Based Multistage Voltage Regulation SiC MOSFET Switching Strategy

Silicon carbide (SiC) metal-oxide semiconductor field-effect transistors (MOSFETs), as a new material, have the advantages of low drain-source resistance, high thermal conductivity, low leakage current, and high switching frequency compared with silicon (Si)-based MOSFETs. Therefore, in many industrial applications, Si MOSFETs have been replaced by SiC MOSFETs. However, as the switching speed increases exponentially, some problems are amplified, the most serious of which is the overshoot of current and voltage. The increase in voltage and current slope caused by high switching speeds inevitably leads to overshoot, oscillations, and additional losses in the circuit. This paper focusses on the actual performance of the optimised switching strategy (OSS) in circuit testing and combines the existing simulation results to verify the practicability of OSS. In this paper, the optimised switching strategy is introduced first, and then, the LTspice model of SiC MOSFET is established in detail and verifies the feasibility of the OSS through half-bridge circuit simulation. Finally, the test platform is built using a programmable gate drive module (2ASC-12A1HP). Through a 400 V/30 A double-pulse test, the practicality of the OSS is verified. The experiments show that the OSS can greatly improve the switching performance of SiC MOSFETs.

Prediction of Thrombus Formation within an Oxygenator via Bioimpedance Analysis.

Blood clot formation inside the membrane oxygenator (MO) remains a risk in extracorporeal membrane oxygenation (ECMO). It is associated with thromboembolic complications and normally detectable only at an advanced stage. Established clinical monitoring techniques lack predictive capabilities, emphasizing the need for refinement in MO monitoring towards an early warning system. In this study, an MO was modified by integrating four sensor fibers in the middle of the hollow fiber mat bundle, allowing for bioimpedance measurement within the MO. The modified MO was perfused with human blood in an in vitro test circuit until fulminant clot formation. The optical analysis of clot residues on the extracted hollow fibers showed a clot deposition area of 51.88% ± 14.25%. This was detectable via an increased bioimpedance signal with a significant increase 5 min in advance to fulminant clot formation inside the MO, which was monitored by the clinical gold standard (pressure difference across the MO (dp-MO)). This study demonstrates the feasibility of detecting clot growth early and effectively by measuring bioimpedance within an MO using integrated sensor fibers. Thus, bioimpedance may even outperform the clinical gold standard of dp-MO as a monitoring method by providing earlier clot detection.

Thermal Safety Characteristic Analysis of Large‐Format Pouch Li‐Ion Capacitors

Lithium‐ion capacitors (LICs), as the next generation of supercapacitors, combine the high power density and long cycle life of supercapacitors with the high energy density of lithium‐ion batteries, presenting broad prospects for applications and becoming a focal point of research in academia and industry. Safety concerns regarding LICs, particularly the crucial issue of thermal safety, have garnered widespread attention. This study investigates the thermal abuse, electrical abuse, and mechanical abuse of 1100 F LICs, including overheating, overcharging, overdischarging, needling, extrusion, and short circuit tests, with real‐time monitoring of temperature, gas emissions, and voltage to explore thermal runaway mechanisms. The results demonstrate that LICs remain safe under abusive conditions, with no occurrences of fire or explosion hazards.

Quantum Multiple Eigenvalue Gaussian filtered Search: an efficient and versatile quantum phase estimation method

Quantum phase estimation is one of the most powerful quantum primitives. This work proposes a new approach for the problem of multiple eigenvalue estimation: Quantum Multiple Eigenvalue Gaussian filtered Search (QMEGS). QMEGS leverages the Hadamard test circuit structure and only requires simple classical postprocessing. QMEGS is the first algorithm to simultaneously satisfy the following two properties: (1) It can achieve the Heisenberg-limited scaling without relying on any spectral gap assumption. (2) With a positive energy gap and additional assumptions on the initial state, QMEGS can estimate all dominant eigenvalues to ϵ accuracy utilizing a significantly reduced circuit depth compared to the standard quantum phase estimation algorithm. In the most favorable scenario, the maximal runtime can be reduced to as low as log⁡(1/ϵ). This implies that QMEGS serves as an efficient and versatile approach, achieving the best-known results for both gapped and gapless systems. Numerical results validate the efficiency of our proposed algorithm in various regimes.

A linear photonic swap test circuit for quantum kernel estimation

Abstract The swap test is a quantum algorithm capable of computing the absolute value of the scalar product of two arbitrary wavefunctions. Scalar products represent a crucial ingredient to many QML methods, but their evaluation is not straightforward at all. For this reason, many research efforts have been made without achieving an efficient and robust implementation. Here, we present an integrated photonic circuit designed to implement the swap test algorithm. Our approach relies solely on linear optical integrated components and qudits, represented by single photons from an attenuated laser beam propagating through a set of waveguides. By utilizing 2$^3$ spatial degrees of freedom for the qudits, we can configure all the necessary arrangements to set any two-qubit state and perform the swap test. This simplifies the requirements on the circuitry elements and eliminates the need for non-linearity, heralding, or post-selection to achieve multi-qubit gates. Our photonic swap test circuit successfully encodes two qubits and estimates their scalar product with a measured root mean square error smaller than 0.05. This result paves the way for the development of integrated photonic architectures capable of performing Quantum Machine Learning tasks with robust devices operating at room temperature.

Different-Mode Power Splitters for Optical Testing of Three-Channel and Dual-Mode Waveguide Crossing

We study that the different-mode (waveguide-connected) power splitter [(W)PS] can provide different-mode testing points for the optical testing. With the PS or WPS providing two different-mode testing points, the measured insertion losses (ILs) of the three-channel and dual-mode waveguide crossing (WC) for both the fundamental transverse electric (TE0) and TE1 modes are less than 1.8 dB or 1.9 dB from 1540 nm to 1560 nm. At the same time, the crosstalks (CTs) are lower than −17.4 dB or −18.2 dB. The consistent test results indicate the accuracy of the (W)PS-based testing circuit. Additionally, combining the tunable tap couplers, the (W)PS can provide multiple testing points with different modes and different transmittances.

Optimization of Ansys CFX Input Parameters for Numerical Modeling of Pump Performance in Turbine Operation

The paper deals with the issue of determining the optimal setting of input variables in Ansys CFX for modeling pump flow in turbine operation (PAT). The pump model was created in Autodesk Inventor. The mesh for numerical simulations was created using Ansys Fluent Meshing, considering the mesh quality parameters’ skewness and aspect ratio. The Ansys CFX computational model was experimentally verified on an actual pump by measuring the performance parameters on a test circuit and using the PIV (particle image velocimetry) method. The research indicated that the most suitable setting for the model input variables was the inlet pressure and PAT flow rate combination. Another option was to adjust the pressure at the pump inlet and outlet. However, the calculation time in this case was up to 30% longer. The comparison of the model results with the experiment showed that the deviations in the numerical model performance values did not exceed 10% of the values measured on the test circuit. Only the calculated torque was 1.2 ± 0.13 Nm higher on average than the torque measured on the test circuit. This difference is most likely due to the simplification of the geometry of the computational mesh in order to reduce the computation time.

A Modified and Customized Wingsuit Flying Search (MCWFS)-based Approach for the Circular Scan Architecture

The circular scan architecture (CSA) is a widely used scan design technique in digital circuit testing that involves scanning test data through a circuit in a circular pattern. Several optimization approaches have been suggested so far to lessen the Test Data Volume (TDV), but no one has shown satisfactory results. Therefore, this paper proposes a Modified and Customized Wingsuit Flying Search algorithm to decrease the test data volume time. The proposed MCWFS-SBA-CSA introduces some novel features that distinguish it from traditional circular scan approaches. The concept of wingsuit flying is an innovative approach in the field of scan systems. This allows the scan that moves more dynamically and efficiently, enabling it to cover a larger area in a shorter time than traditional circular-scan approaches. After this phase, only scan-chosen inputs are required to obtain the next test pattern from the captured response. Therefore, required less Automatic test equipment (ATE) memory in this research so there is a Decreased cost in system-on-chip (SOC). The proposed method attains fast global searching capacity. The efficiency of the proposed technique attains 26.42%, 32.45%, and 29.34% higher compression ratio (CR), Test Application Time (TAT) reduction of SC-128 attains 29.45%, 34.67%, and 40.22% higher, TDV of SC-256 attains 32.23%, 36.34%, and 39.23% higher than existing methods, such as TDV for Circular Scan Approaches utilizing Modified Shuffled Shepard Optimization (TDV-CSA-MSSO), Effectual Very-large-scale integration Test data compression system for CSA under modified and colony metaheuristic (ETDC-CSA-MACMH), and Test Data Compression Utilizing Tetrad state Skip System (TDC-DC-TSSC) for Digital Circuits, respectively.

Automatic Test Pattern Generation for Robust Quantum Circuit Testing

Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This article alleviates the issue by proposing a novel framework of automatic test pattern generation (ATPG) for robust testing of logical quantum circuits. We introduce the stabilizer projector decomposition (SPD) for representing the quantum test pattern and construct the test application (i.e., state preparation and measurement) using Clifford-only circuits, which are rather robust and efficient as evidenced in the fault-tolerant quantum computation. However, it is generally hard to generate SPDs due to the exponentially growing number of the stabilizer projectors. To circumvent this difficulty, we develop an SPD generation algorithm, as well as several acceleration techniques that can exploit both locality and sparsity in generating SPDs. The effectiveness of our algorithms are validated by (1) theoretical guarantees under reasonable conditions and (2) experimental results on commonly used benchmark circuits, such as Quantum Fourier Transform (QFT), Quantum Volume (QV), and Bernstein-Vazirani (BV) in IBM Qiskit.

Evaluation of the power loss in IGBT single transistor device under the condition of pulse duration of 100 ns

The improvement in the reliability and lifespan of insulated gate bipolar transistor (IGBT) devices and the enhancement of system efficiency under high-frequency pulse conditions are receiving increasingly wide attention, and all of these are closely related to the evaluation of the power loss of the IGBT. The traditional method for assessing the power loss of the IGBT is through curve fitting of the dual-pulse experimental results, without delving into the conduction process of the IGBT and without considering the IGBT model itself and the parasitic parameters present in the test circuit. In response to the condition of a pulse duration of 100 ns for IGBT single devices, a universal test circuit has been designed to measure the collector-emitter voltage waveform and the collector current waveform. A method based on Computer Simulation Technology for field-circuit co-simulation to evaluate the power loss of the IGBT has been proposed, which takes into account the parasitic parameters in the actual circuit. In this method, the 3D model of the IGBT device, as well as the circuit model of the test circuit, is established. The power loss curve of the IGBT was obtained from the evaluation model, and the results agree well with the power loss curve obtained from experiments. This method provides guidance for seeking lower power loss in order to improve the reliability and lifespan of the IGBT, as well as enhance system efficiency. It also provides theoretical guidance for further research on the thermal damage mechanism of the IGBT.

Analysis of different test techniques of DC circuit breaker

Abstract Amidst the escalating demand for energy and the proliferation of renewable energy sources, direct current (DC) systems have garnered increasing interest. As pivotal for the safety and reliability of DC systems, testing DC circuit breakers is a critical step to evaluate their performance and dependability. This study focuses on the breaking test method for medium and high-voltage DC circuit breakers. It compares and evaluates the current waveform, recovery voltage, and energy dissipation across various test circuit methodologies during the breaking process of DC circuit breakers and assesses the suitability of test methods across different voltage levels.

Effect of nutritional status on the performance components of physical fitness of amateur basketball players in Makurdi, Benue State, Nigeria

Optimal nutritional status is crucial for enhancing the physical fitness components of amateur basketball players as it directly influences their strength, endurance, and overall performance. This study assessed the effect of nutritional status on the performance components of physical fitness of amateur basketball players in Makurdi, Benue State, Nigeria. This was a cross-sectional ex post facto study. Participants were 80 (40 male and 40 female) secondary school basketball players from a population of 160 (80 males (8 teams) and 80 females (8 teams) who were selected using random sampling technique from 16 registered teams from the 2023 Benue State Secondary School Basketball League organized by the Benue State Sports Council, Makurdi. All the participants underwent nutritional assessment based on WHO standards. The participants’ height and weight were measured in accordance with the protocol of ISAK. The Slalom test was performed to evaluate agility. The Harre circuit test (HCT) was used to assess coordination. Speed was assessed using the 50m dash. Reaction time was assessed using the reaction time ruler drop test. In all the tests, those with lower time were considered to be more fit and vice versa. Mean and standard deviation were computed for the performance of the participants in agility, coordination, speed and reaction time. The participants were split into three in relation to nutritional status (normal, thin/wasted and stunted). The analysis of variance was used to find out the different performance components of adolescents in relation to nutritional status. All the analyses were performed on 95% confidence intervals using the statistical package for social sciences (SPSS v21). The result of the study indicated that nutrition has significant effects on agility (F=10.495, df=2, 77; p<0.05), coordination (F=17.750, df=2, 77; p<0.05), speed (F=5.908, df=2, 77; p<0.05) and reaction time (p<0.05) of amateur basketball players in Makurdi. It was concluded that nutritional status has a significant effect on several key performance components of physical fitness among amateur basketball players in Makurdi, Benue State, Nigeria. It was recommended among others that coaches should take the nutritional status of their players as important as other parameters to ensure a better performance of their players in basketball. Key words: Nutritional status, physical fitness, performance, amateur, basketball, secondary school

DEVELOPMENT AND APPLICATION OF A WEARABLE TECHNOLOGY PRODUCT THAT DETECTS AND INFORMS THE PRESENCE OF ELECTRICAL ENERGY

Electrical energy has both positive and negative effects nowadays, with the potential to cause property and human loss. Technical professionals working at electrical energy generation, distribution, and utilization points may die due to carelessness or neglect. Although there are protection elements (fuses, residual current protection relays, etc.) in electrical panels that interrupt the flow of electrical energy in the event of a shock, there may be working areas where energy cannot be cut off due to incorrect electrical connections caused by unauthorized people interacting with the panel. Existing protective components may be insufficient. The experiments include both wired protection elements and wireless detection elements. However, they need to be enhanced because they have limited detection distances. Furthermore, using an ergonomic design can improve operability. New protection and warning features must be designed using developing technology. To prevent employees from being shocked by being exposed to electrical energy in the workplace, AC voltage can be detected without contact using this study, which includes the design and test results of a wearable technology product that warns when electricity is present. An electrical circuit that technical staff can wear on their finger detects voltage without contact and displays the existence of energy with a red LED. It was discovered that the test circuit detects 230V AC electrical energy up to 8 cm away and warns with light.

Study of Parasitic Effects for Accurate Dynamic Characterization of SiC MOSFEFTs: Comparison between Experimental Measurements and Numerical Simulations

The high-speed switching capabilities of wide bandgap (WBG) power devices have posed challenges in accurately evaluating their dynamic characteristics, primarily due to the increasing influence of parasitic components in switching test circuits. To address this issue, we investigated the impact of parasitics by conducting dynamic tests and schematic-level transient simulation on a half-bridge switching circuit incorporating SiC MOSFETs. This comparative analysis identified specific parasitic components responsible for undesirable behaviors such as spikes and ringing in the switching waveform. Our findings provide insights into which parasitic components in the test circuit are critical for the accurate dynamic characterization of SiC MOSFETs.

Design Proposals for High-Voltage Stacked Configuration GaN Module

In this paper, the operational verification of the stacked transistor configuration is provided, focusing on the use of GaN transistors. The methodology is based on simulated and laboratory experiments. The stacked transistor configuration appears to be a promising solution to increase the voltage-blocking capability of GaN technology for high-voltage operations. Currently available GaN transistors are manufactured for 650 V of blocking voltage. Devices with a higher voltage-blocking capability are not currently available. Therefore, the stacked module was verified, while the main focus was on the driving circuit design, verification, and testing. For this purpose, two alternatives of GaN transistor technology have been compared. The main goal was to reach 800 V of blocking voltage with acceptable voltage deviation for nominal power of a power semiconductor converter.

A Power Optimization Approach for Large-scale RM-TB Dual Logic Circuits Based on an Adaptive Multi-Task Intelligent Algorithm

Logic synthesis is a crucial step in integrated circuit design, and power optimization is an indispensable part of this process. However, power optimization for large-scale Mixed Polarity Reed-Muller (MPRM) logic circuits is an NP-hard problem. In this article, we divide Boolean circuits into small-scale circuits based on the idea of divide and conquer using the proposed Dynamic Adaptive Grouping Strategy (DAGS) and the proposed circuit decomposition model (CDM). Each small-scale Boolean circuit is transformed into an MPRM logic circuit by a polarity transformation algorithm. Based on the gate-level integration, we integrate small-scale circuits into an MPRM and Boolean Dual Logic (RBDL) circuit. Furthermore, the power optimization problem of RBDL circuits is a multi-task, multi-extremal, high-dimensional combinatorial optimization problem, for which we propose an Adaptive Multi-task Intelligent Algorithm (AMIA), which includes global task optimization, population reproduction, valuable knowledge transfer (VKT), and local exploration to search for the lowest power for RBDL circuits. Moreover, based on the proposed Fast Power Decomposition Algorithm (FPDA), we proposed a Power Optimization Approach (POA) for an RBDL circuit with the lowest power using the AMIA. Experimental results based on Microelectronics Center of North Carolina (MCNC) Benchmark test circuits demonstrate the effectiveness and superiority of the POA compared to state-of-the-art POAes.

A Reduced-Order Model of the Coupled Venting-Thermal-Electrochemical Behavior to Predict First Venting Under External Short Circuit Conditions

Modeling abusive battery operation before thermal runaway (TR) can reduce the testing requirements and facilitate the development of effective and reliable early failure detection and fast discharge strategies [1] which require multiple types of sensor signals, including current, voltage, temperature, and pressure. We present a multi-physics model that can predict the rapidly evolving discharge behavior of cells undergoing an external short circuit, including hazards like first venting. First venting models account for gas generation due to SEI decomposition and electrolyte vaporization at high temperatures to calculate the build-up of internal cell pressure under constant-displacement conditions [2]. Modeling gas generation requires accurate temperature prediction, which subsequently requires accurate Joule heating calculated from current and voltage predictions. From the cascading chain of model input dependencies, the first challenge is managing error propagation through the submodels with appropriate parameterization. Previous modeling work parameterized a venting model for a cell undergoing an external short circuit (ESC) but did not include a thermal or electrical model [2]. The second challenge is modeling the diffusion-limited discharge behavior with currents approaching 50-80 C with a fast and accurate model that is feasible for detection and control applications. Diffusion-limited behavior occurs when the local Li concentration saturates, suddenly causing large concentration overpotentials that are observable in the terminal voltage and current (see Fig. 1) as well as numerical instability when solving the Butler-Volmer (BV) equation. Previous ESC modeling works either used the Doyle-Fuller-Newman (DFN) model with a limiting current density in the BV equation [3] or an equivalent circuit model (Eq-CM) [1]. However, solving the DFN is computationally intensive for a control application, while Eq-CMs cannot predict the diffusion-limited electrical behavior beyond the data they were parameterized on, requiring apriori experiments to be accurate. To balance the trade-offs, we instead look towards reduced-order modeling.In this work, we present a control-oriented, reduced-order, multi-physics model that captures the electrochemical, thermal, and venting behavior of four 4.6 Ah NMC pouch cells undergoing an external short circuit with different initial state-of-charge (SOC). The multi-physics model couples a first venting model with a lumped thermal model driven by Joule heating calculated through the overpotentials from the Single-Particle Model with electrolyte (SPMe). The combined model was parameterized through four experiments by fitting five key parameters in the submodels related to the SEI decomposition rate, cell thermal behavior, and solid electrode diffusion to capture the first venting timing, peak temperature, and diffusion-limited current-voltage drops. Additionally, two resistances were tuned to match the initial current and voltage with all other parameters were taken from the literature. Applying the same parameter set consisting of the average of the fitted values on all four cells, the combined multi-physics model correctly predicted that the fully-charged cells would vent and conservatively predicted the cell venting timing up to about 40 s before it occurred in the experiment. For high initial SOC cells, the SPMe also accurately predicted the current and voltage drops associated with diffusion limitations and SOC up until the cell vented. This is the first work that systematically parameterizes and couples a reduced-order, physics-based model to capture the electrical, thermal, and venting behavior under battery abuse conditions. Future work will explore applications for the model in early detection and response to critical safety events.REFERENCES[1] Tran, Vivian, Jason Siegel, and Anna Stefanopoulou. "Emergency Li-ion Battery Discharge using Nonlinear Model Predictive Control with Temperature and Venting Pressure Constraints." 2023 American Control Conference (ACC). IEEE, 2023.[2] Cai, Ting, et al. "Modeling li-ion battery first venting events before thermal runaway." IFAC-PapersOnLine 54.20 (2021): 528-533.[3] Rheinfeld, Alexander, et al. "Quasi-isothermal external short circuit tests applied to lithium-ion cells: Part ii. modeling and simulation." Journal of The Electrochemical Society 166.2 (2019): A151. Fig. 1: 15-min simulation of an external short circuit for cells at different initial SOC. Model results and experimental measurements are shown for four cells that were externally shorted. The measured current, voltage, temperature, and expansion force were measured at 10 Hz and plotted versus log time to highlight the dynamic current-voltage behavior in the first few minutes. The diffusion-limited current and voltage behavior are captured by the model. The two cells at 100% SOC, experienced venting and higher peak temperatures, which are well captured by the model. The cell venting timing was predicted to be 43 s and 7 s early for Cell 100A and 100B, respectively. The cells that were shorted at lower SOC did not vent. Figure 1

Picosecond Femtojoule Resistive Switching in Nanoscale VO2 Memristors.

Beyond-Moore computing technologies are expected to provide a sustainable alternative to the von Neumann approach not only due to their down-scaling potential but also via exploiting device-level functional complexity at the lowest possible energy consumption. The dynamics of the Mott transition in correlated electron oxides, such as vanadium dioxide, has been identified as a rich and reliable source of such functional complexity. However, its full potential in high-speed and low-power operation has been largely unexplored. We fabricated nanoscale VO2 devices embedded in a broadband test circuit to study the speed and energy limitations of their resistive switching operation. Our picosecond time-resolution, real-time resistive switching experiments and numerical simulations demonstrate that tunable low-resistance states can be set by the application of 20 ps long, <1.7 V amplitude voltage pulses at 15 ps incubation times and switching energies starting from a few femtojoule. Moreover, we demonstrate that at nanometer-scale device sizes not only the electric field induced insulator-to-metal transition but also the thermal conduction limited metal-to-insulator transition can take place at time scales of 100s of picoseconds. These orders of magnitude breakthroughs can be utilized to design high-speed and low-power dynamical circuits for a plethora of neuromorphic computing applications from pattern recognition to numerical optimization.

Printed circuit board and printed circuit board assembly methods for testing and visual inspection: a review

Testing and visual inspection of printed circuit boards (PCBs) and printed circuit board assemblies (PCBAs) are important procedures in the manufacturing process of electronic modules and devices related to locating and identifying possible defects and failures. Earlier defects detection leads to decreasing expenses, time and used resources to produce high quality electronics. In this paper an exploration and analysis about the current research regarding methods for PCB and PCBA testing, techniques for defects detection and vusial inspection is performed. The impact of machine and deep learning for testing and visual inspection procedures is also investigated. The used methodology comprises bibliometric approach and content analysis of papers, indexed in scientific database Scopus, considering the queries: “PCB and testing” and “PCB and testing”, “printed circuit board assembly and testing” and “PCBA and testing”, “PCB defect detection” and “PCBA defect detection”, “PCB and visual inspection”, and “PCBA and visual inspection”. The findings are presented in the form of a framework, which summarizes the contemporary landscape of methods for PCBs and PCBAs testing and visual inspection.

Quantum multi-state Swap Test: an algorithm for estimating overlaps of arbitrary number quantum states

Estimating the overlap between two states is an important task with several applications in quantum information. However, the typical swap test circuit can only measure a sole pair of quantum states at a time. In this study, a recursive quantum circuit is designed to measure overlaps of n quantum states |ϕ1〉,|ϕ2〉,…|ϕn〉\\documentclass[12pt]{minimal} \\usepackage{amsmath} \\usepackage{wasysym} \\usepackage{amsfonts} \\usepackage{amssymb} \\usepackage{amsbsy} \\usepackage{mathrsfs} \\usepackage{upgreek} \\setlength{\\oddsidemargin}{-69pt} \\begin{document}$\\left | {\\phi _{1} } \\right \\rangle ,\\left | {\\phi _{2} } \\right \\rangle ,\\ldots\\left | {\\phi _{n} }\\right \\rangle $\\end{document} concurrently with O(k2k)\\documentclass[12pt]{minimal} \\usepackage{amsmath} \\usepackage{wasysym} \\usepackage{amsfonts} \\usepackage{amssymb} \\usepackage{amsbsy} \\usepackage{mathrsfs} \\usepackage{upgreek} \\setlength{\\oddsidemargin}{-69pt} \\begin{document}$O(k2^{k})$\\end{document} controlled-swap(CSWAP) gates and O(k)\\documentclass[12pt]{minimal} \\usepackage{amsmath} \\usepackage{wasysym} \\usepackage{amsfonts} \\usepackage{amssymb} \\usepackage{amsbsy} \\usepackage{mathrsfs} \\usepackage{upgreek} \\setlength{\\oddsidemargin}{-69pt} \\begin{document}$O(k)$\\end{document} ancillary qubits, where k=⌈logn⌉\\documentclass[12pt]{minimal} \\usepackage{amsmath} \\usepackage{wasysym} \\usepackage{amsfonts} \\usepackage{amssymb} \\usepackage{amsbsy} \\usepackage{mathrsfs} \\usepackage{upgreek} \\setlength{\\oddsidemargin}{-69pt} \\begin{document}$k=\\left \\lceil {\\log n} \\right \\rceil $\\end{document}. All pairwise overlaps among input quantum states |〈ϕi|ϕj〉|2\\documentclass[12pt]{minimal} \\usepackage{amsmath} \\usepackage{wasysym} \\usepackage{amsfonts} \\usepackage{amssymb} \\usepackage{amsbsy} \\usepackage{mathrsfs} \\usepackage{upgreek} \\setlength{\\oddsidemargin}{-69pt} \\begin{document}$|\\langle \\phi _{i}|\\phi _{j}\\rangle |^{2}$\\end{document} can be obtained in this circuit. Compared with existing scheme for measuring the overlap of multiple quantum states, the circuit provides higher precision and less consumption of ancillary qubits. In addition, some simulation experiments are performed on IBM quantum cloud platform to verify the superiority of this algorithm.