The scanning acoustic tunneling microscope is based on the conventional scanning tunneling microscope and extends its topography-mapping capability to the investigation of both amplitude and phase of surface acoustic waves (SAWs) with frequencies in the MHz range. The mechanical oscillation of the surface induced by the SAW modulates the tunneling current. By adding a sinusoidal high frequency signal to the dc tip voltage this ac tunneling current signal is mixed down to an easily detectable low frequency signal. Here, we report the first ultrahigh vacuum (UHV)-compatible version of this technique including provision for sample transfer and in situ surface preparation. Since both signal-to-noise ratio and spatial resolution are significantly enhanced in UHV, acoustic oscillations of topography features can be investigated on the nanoscale. At present, SAW frequencies up to 400 MHz have been successfully fed into the UHV system.
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