Previously measured low-energy electron diffraction (LEED) intensity data for the (110) surfaces of the isoelectronic series GaP, ZnS, and CuCl, are reanalyzed using dynamical LEED calculations, a new selection of independent structural variables, and an automated optimization procedure. The bond lengths of the atoms in the top layer and perpendicular displacements of the cation-anion sublattices in the top two layers are selected as the independent structural variables. All other bond lengths are taken to be equal to their bulk values. An automated gradient method search procedure is utilized to obtain these structural variables by optimizing the fit of the measured intensities by the calculated ones as determined by the x-ray R factor. This procedure permits a precise comparison of the bond lengths of species in the top layer from one material to another. Our major finding is that the bond lengths, d, between the anion and cation in the top layer depend on the spectroscopic ionicity, f, via [(d−dB)/dB]=0.025−0.14f, in which dB is the bulk value of the bond length. The bonds between surface and subsurface species do not exhibit a systematic dependence on f.