MEMS devices are nearly ubiquitous, with applications ranging from automobiles to toys, medical equipment to missiles, and cell phones to industrial equipment. At the microscale, fabrication tolerances are significantly less precise than at the scale of traditional machining techniques. This can result in significant differences in the operating characteristics between otherwise identical MEMS devices. A wide bandwidth random excitation source is ideal for evaluating these components, whether used as the forcing function for an electromechanical shaker employed to measure transmissibility, or as a voltage source to evaluate actuator structure resonances and instabilities. An electronic chaotic oscillator provides an ideal wide bandwidth voltage source which is provably random from first principles and may be simply integrated for the aforementioned MEMS testing. This type of system is easily integrated through standard Si MEMS processes and readily lends itself to application as a built-in-self test (BIST) component. These systems guarantee uniform frequency content from D.C. up to 100kHz due to their characteristically random behavior and serve as a strong candidate for providing uniform spectral density to a device under test. The proposed system is a simple, electronic circuit that creates a random, wideband excitation voltage for observing characteristics of MEMS devices. This functionality is achieved by the analog, digital or mixed signal computation of nonlinear differential equations that describe various exactly solvable chaotic systems. By creating Si microsystems which perform these computations, these test sources may be readily fabricated as integrated BIST components for MEMS devices or fabricated separately and integrated by flip chip assembly techniques. Furthermore, by considering the iterated map of this particular category of stimulation source, a direct and easy measurement of the stimulation entropy may be monitored and corrected. This work begins as a theoretical treatment involving the Nonlinear Dynamics of these types of systems including chaotic systems which permit closed form solutions. These systems are described classically through nonlinear differential equations and intuitively through iterated maps. These techniques reveal inherent methods for entropy measurement in these sources which may be implemented and controlled easily using electronic circuits. Subsequently, the simulation, circuit design methodology, circuit simulation, fabrication, testing and hardware verification of these wideband chaotic sources is presented. The development of this work delineates simple, wideband electronic testing circuits which may be fully integrated with MEMS devices using standard Si MEMS processes. The resulting microsystem may be used as the forcing function when measuring transmissibility of MEMS devices, or as a BIST element to evaluate MEMS microstructure characteristics through direct microelectronic fabrication or flip chip integration.
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