ZnO thin-films were deposited by spray pyrolysis and RF magnetron sputtering techniques. The optical reflection of these thin-films is measured using UV-Vis spectrophotometer. The measured optical reflection data is used in PC-1D simulation software to study the output performance of commercial silicon wafer-based solar cell. As far as optical performance is concerned it could be demonstrated that the sprayed ZnO thin-film under laboratory conditions show equivalent performance compared to sputtered ZnO thin-film. The influence of optical properties of 65 nm thick zinc oxide thin-films deposited by vacuum and non-vacuum techniques on quantum efficiency and IV characteristics of commercial silicon-wafer based solar cell is studied and reported here.