Abstract

In this work, ZnO thin films have been grown on glass substrates by using a solution of propanol (C 3H 8O), water (H 2O) and zinc acetate (Z n (CH 3CO 2) 2) in acidified medium (pH 5). The obtained films were n doped with ytterbium (Yb) at the rates of 100, 200 and 300 ppm. The structural features of the doped films were investigated using XRD, atomic force microscopy and scanning electronic microscopy techniques. XRD analysis shows a strong (0 0 2) X-ray diffraction line for increasing Yb-doping amounts. This c-axis preferential orientation of ZnO crystallites is naturally required to use this oxide as transparent conductor in optoelectronic applications. Atomic force microscopy (AFM) analysis shows an enhancement in the surface roughness of the doped ZnO:Yb thin films. Optical measurements were performed in 300–1800 nm domain via transmittance T( λ) and reflectance R( λ) spectra. Conjoint optical and thermal properties were deduced from the optical measurements in reference to the Amlouk–Boubaker opto-thermal expansivity ψ AB. Optically relevant ytterbium doping effects have been discussed. Finally, mechanical measurements have been carried out using Vickers standard disposal. The results confirmed the structural and functional changes that several recent studies attributed to ytterbium doping.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.