Abstract Copper based chalcogenides have garnered growing importance in the area of thin film photovoltaics. Cu2MgSnS4 (CMTS) is one of the newest materials in this family of materials. It is a p-type material which find multiple applications in the field of photovoltaics. Cu2MgSnS4 thin films were deposited onto soda lime glass substrates using automated vacuum spray pyrolysis technique at a substrate temperature of 300 °C and annealed at different temperatures from 300 °C to 375 °C in steps of 25°C. The structural, elemental, morphological, optical, and electrical properties of the material were studied. X-Ray Diffraction studies showed that annealing eliminates impurity phases and improves crystallinity. Field Emission Scanning Electron Microscopy studies showed improved grain size and uniform deposition of the films. The energy bandgap of the as-prepared film is 2.02 eV and that of annealed films are around 2.5 eV. Hall measurements show that the material exhibit p-type conductivity with high value of conductivity, mobility and bulk concentration. Heterojunction devices were fabricated with chemical bath deposited CdS as a buffer layer and spray deposited Aluminium doped Zinc Oxide (Al:ZnO) as n-layer. Silver contacts were placed as electrodes over the top layer. The fabricated device architecture is <FTO/AZO/CdS/CMTS/Ag>. The junction parameters including rectification ratio, knee voltage, series resistance and Ideality factor of all the devices are calculated. The device annealed at 375 °C showed an ideality factor of 2.23, which is the best among all the fabricated devices.
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