Electron-surface interaction plays a fundamental role in surface science, which could evolve into an electronic avalanche under a high electrical field, resulting in devastating device failures. In the present study, using a thin polymer film approach, the effective surface layer, whose thickness is estimated to be about 200 nm, where the electron-surface interaction occurs is directly probed. The morphological evolution of thin polymer films with thicknesses from nanometers to micrometers is investigated with a focus on its influence on the electron avalanche process (or flashover) under a dc electric field in vacuum. It is found that the film thickness dependence of flashover is divided into three parts, i.e., fast increase, slow increase, and saturation, each of which has a dominant microscopic mechanism. The results indicate that the secondary electron emission (SEE) yield decreases significantly even when a discontinuous polymer layer is deposited, which varies little afterward. In contrast, the shallow surface traps develop into deep ones with the film thickness. The density ratio of deep traps increases exponentially after a continuous film is formed. The clear transition from SEE dominated to surface charge trap dominated flashover and their unique dependence on film morphology provide a deeper insight into the electron-surface interaction, which can be used for theoretical modeling, surface modification, and advanced functional devices.
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