Wire spring-hole connectors are widely used in the aerospace system in recent years due to their characteristics of low contact resistance and small insertion force. Contact failure is the main failure mode of wire spring-hole electrical connectors. By analyzing the contact failure mechanism of wire spring-hole electrical connectors, it is clear that the leading causes of contact failure are the growth of the oxide film layer on the surface of the contact and the stress relaxation of the wire spring. Based on the reaction kinetics and tunneling theory, the evolution of the tunneling resistivity of the oxide film layer on the surface is described. The rule of contact stress is revealed by establishing a mechanical model of wire spring. Furthermore, combing with the physical equation of accelerated failure of contact resistance, a contact reliability design model with design parameters is established. Finally, the model is verified by utilizing the accelerated test data of a type of wire spring-hole electrical connector. This model provides a theoretical basis for the reliability evaluation and design of wire spring-hole electrical connectors in the long-term storage environment.