A novel Nd2O3-doped recycled SLS glasses sputtered with GaN were synthesized using the common melt-quenching method. The synthesized glassy samples were investigated by characterizing them structurally, physically, and optically. XRF revealed a SiO2 content of 70.81 wt% from the SLS sample. XRD discovered the amorphous nature of the studied glasses. FTIR confirmed the structural alterations and presence of functional groups. With the inclusion of Nd2O3, the Vm, and ρ increased due to the greater Mwt of Nd2O3 and the wider ionic radius of Nd3+ creating more NBO thereby expanding the glass structure. Using the Tauc model, the Egopt was derived. The direct band gap decreased from 3.51 to 3.38 eV with increasing Nd2O3, however the indirect band gap shows an energy increase, from 2.01 to 2.25 eV. The refractive index decreased with increasing Nd2O3 while the Urbach energy increased with Nd2O3. The influence of the GaN target deposited on the glass surface using RF sputtering is noticed clearly in the sample's surface morphology (AFM) which increases the root-mean-square (RMS) roughness value from 571 to 872 nm which is confirmed in the FESEM results.