Scanning probe microscopy employing conductive probes is a powerful tool for theinvestigation and modification of electrical properties at the nanoscale. Application areasinclude semiconductor metrology, probe-based data storage and materials research.Conductive probes can also be used to emulate nanoscale electrical contacts. However,unreliable electrical contact and tip wear have severely hampered the widespread usage ofconductive probes for these applications. In this paper we introduce a force modulationtechnique for enhanced nanoscale electrical sensing using conductive probes. This techniqueresults in lower friction, reduced tip wear and enhanced electrical contact quality.Experimental results using phase-change material stacks and platinum silicide conductiveprobes clearly demonstrate the efficacy of the proposed technique. Furthermore,conductive-mode imaging experiments on specially prepared platinum/carbonsamples are presented to demonstrate the widespread applicability of this technique.