You have accessMoreSectionsView PDF ToolsAdd to favoritesDownload CitationsTrack Citations ShareShare onFacebookTwitterLinked InRedditEmail Cite this article Bowen Keith and >Tanner Brian 1999Preface to X–ray topography and cystal characterization. A Theme issue published by The Royal Society.Phil. Trans. R. Soc. A.3572629http://doi.org/10.1098/rsta.1999.0452SectionYou have accessPreface to X–ray topography and cystal characterization. A Theme issue published by The Royal Society. Keith Bowen Keith Bowen Google Scholar Find this author on PubMed Search for more papers by this author and Brian >Tanner Brian >Tanner Google Scholar Find this author on PubMed Search for more papers by this author Keith Bowen Keith Bowen Google Scholar Find this author on PubMed Search for more papers by this author and Brian >Tanner Brian >Tanner Google Scholar Find this author on PubMed Search for more papers by this author Published:01 October 1999https://doi.org/10.1098/rsta.1999.0452AbstractThis Theme Issue on X–ray topography and crystal characterization is dedicated to Professor Andrew Lang on the occasion of his seventy–fifth birthday. Since his invention of high–resolution X–ray topography in 1959, a very wide range of applications has been found. At that time, relatively few crystals were available of sufficiently high perfection to benefit from the technique. Since then, the growth of the electronics industry and the application of Lang topography itself to problems of crystal growth have meant that studies of materials as diverse as silicon, diamond, copper, iron, sapphire, ferroelectrics, explosives and delicate organic crystals have proven fruitful. The development of synchrotron radiation topography in the late 1970s led to a resurgence of interest and the development of dedicated beamlines for X–ray imaging at the major synchrotron radiation laboratories. Andrew himself has moved with these developments and even in retirement remains an active user of the Daresbury SRS. This volume also attests to the fact that many of those originally inspired to work in X–ray topography have branched into other fields of X–ray science, from tomographic crack imaging to the application of genetic algorithms to the inverse problem of X–ray scattering. Next Article VIEW FULL TEXT DOWNLOAD PDF FiguresRelatedReferencesDetailsCited by Wild B, Daval D, Micha J, Bourg I, White C and Fernandez-Martinez A (2019) Physical Properties of Interfacial Layers Developed on Weathered Silicates: A Case Study Based on Labradorite Feldspar, The Journal of Physical Chemistry C, 10.1021/acs.jpcc.9b05491, 123:40, (24520-24532), Online publication date: 10-Oct-2019. Feng J, Huang Q, Qi R, Xu X, Zhou H, Huo T, Giglia A, Yang X, Wang H, Zhang Z and Wang Z (2019) Stability of Cr/C multilayer during synchrotron radiation exposure and thermal annealing, Optics Express, 10.1364/OE.27.038493, 27:26, (38493), Online publication date: 23-Dec-2019. This Issue01 October 1999Volume 357Issue 1761Theme Issue ‘X–ray topography and crystal characterization’ compiled by D. K. Bowen and B. K. Tanner Article InformationDOI:https://doi.org/10.1098/rsta.1999.0452Published by:Royal SocietyPrint ISSN:1364-503XOnline ISSN:1471-2962History: Published online01/10/1999Published in print01/10/1999 License: Citations and impact