Abstract: In the article, the author presents the results of an analysis of the metrological parameters of optoelectronic measuring systems with power supply to the transmitting parts from the receiving parts through separate and combined channels for transmitting information and energy. It is shown that circuits with separate channels for transmitting information and energy do not deteriorate the metrological characteristics of the information-measuring measuring system and do not impose any restrictions on the structure of its transmitting part associated with its energy consumption. For circuits with combined channels, with phase or spectral channel multiplexing methods, due to the mutual influence of optical radiation transmitting energy and information on each other, a deterioration in the signal-to-noise ratio of the information-measuring part of the sensor occurs due to the effects of continuum generation and stimulated Raman scattering only in in case where the optical radiation power is significant. If the compaction of the channels is temporary, the mutual influence of the channels can be neglected.