Positron Annihilation Induced Auger Electron Spectroscopy Research Articles

Digital methods for the coincident measurement of the energies of positron-induced electrons and Doppler-shifted annihilation gamma quanta

Here we describe the methods employed for the analysis of digitized data produced by electron time-of-flight and gamma spectrometers that are part of the recently completed advanced positron beam system at the University of Texas at Arlington. The digitization of the data acquisition methods enabled the coincident measurement of the energies of the positron-induced electrons and the Doppler shifted annihilation gamma. Additionally, the digitization of data acquisition methods has led to the development of a multi-stop time-of-flight spectrometer. The digital analysis methods employed in the extraction of timing and energy information from the detector traces have resulted in (i) a digital time-of-flight spectrum of positron-induced secondary electrons utilizing signals from a micro-channel plate (MCP) electron detector and a high-purity germanium gamma detector (HPGe); (ii) a two-dimensional spectrum representing the correlation between the energy of the annihilation gamma and the times-of-flight of positron-induced secondary electrons; and (iii) the first spectra of positron-induced multiple secondary electrons. The digital analysis methods, when applied to positron annihilation-induced Auger electron spectroscopy (PAES), will be capable of providing the energy and momentum of the electron with which the positron annihilates. This information will allow the determination of the contribution of individual atomic orbital levels to the total Doppler broadening spectrum, and may contribute to the understanding of the interaction of positrons with novel two-dimensional materials. The digital multi-stop time-of-flight spectrometer is expected to aid in the quest to unravel the complex decay pathways associated with the Auger decay of annihilation-induced core holes.

In-situ observation of the temperature and orientation dependence of the surface concentration of Ni adatoms deposited on Pd

We report the direct observation of the in-situ temperature-dependent migration of Ni adatoms in Pd using Positron annihilation induced Auger Electron Spectroscopy (PAES). For this study, a single atomic layer of Ni was grown on Pd with the crystallographic orientations Pd(111), Pd(110) and Pd(100). The sample temperature was increased from room temperature to 350 °C and the intensity of the Ni and Pd signal was evaluated from the recorded PAES spectra. Due to the outstanding surface sensitivity of PAES a clear tendency for Pd segregation at the surface was observed for all samples. Moreover the activation temperature T0 for surface segregation was found to depend strongly on the surface orientation: We determined T0 to 172± 4 °C, 261± 12 °C and 326± 11 °C for Pd(111), Pd(100) and Pd(110), respectively.

Comparative Study of Time-Dependent PAES and XPS on a Ni/Pd Surface

We report on time-dependent Positron annihilation induced Auger Electron Spectroscopy (PAES) study on 0.5 monolayers (ML) Ni on polycrystalline Pd accompanied by complementary X-ray induced Photoelectron Spectroscopy (XPS). The normalized PAES spectra showed a significant decrease in the Ni intensity and an increase in the Pd intensity as a function of time. To rule out varying influence on the elements e.g. from surface contaminates due to the residual gas, a time-dependent XPS analysis was performed on pure Ni and Pd as well as to analyze the main contaminants C and O. The O fraction was found to be constant within the measurement time and the time constants for C significantly differ from those of Ni and Pd in the PAES data. Consequently, it was concluded that the PAES data show a superposition of C contamination and structural changes at the surface of Ni/Pd.

Low energy positron beam system for the investigation of 2D and porous materials

An advanced variable energy positron beam (~2 eV to 20 keV) has been designed, tested and utilized for coincidence Doppler broadening (CDB) measurements at the University of Texas at Arlington (UTA). A high efficiency solidified rare gas (Neon) moderator was used for the generation of a slow positron beam. The gamma rays produced as a result of the annihilation of positrons with the sample electrons are measured using a high purity Germanium (HPGe) detector in coincidence with a NaI(Tl) detector. Modifications to the system, currently underway, permits simultaneous measurements utilizing Positron annihilation induced Auger Electron Spectroscopy (PAES) and CDB. The tendency of positrons to become trapped in an image potential well at the surface will allow the new system to be used in measurements of the chemical structure of surfaces, internal or external and interfaces. The system will utilize a time of flight (TOF) technique for electron energy measurements. A 3m flight path from the sample to a micro-channel plate (MCP) in the new system will give it superior energy resolution at higher electron energies as compared to previous TOF systems utilizing shorter flight paths.

Iterative fitting method for the evaluation and quantification of PAES spectra

The elemental composition of surfaces is of great importance for the understanding of many surface processes such as catalysis. For a reliable analysis and a comparison of results, the quantification of the measured data is indispensable. Positron annihilation induced Auger Electron Spectroscopy (PAES) is a spectroscopic technique that measures the elemental composition with outstanding surface sensitivity, but up to now, no standardized evaluation procedure for PAES spectra is available. In this paper we present a new approach for the evaluation of PAES spectra of compounds, using the spectra obtained for the pure elements as reference. The measured spectrum is then fitted by a linear combination of the reference spectra by varying their intensities. The comparison of the results of the fitting routine with a calculation of the full parameter range shows an excellent agreement. We present the results of the new analysis method to evaluate the PAES spectra of sub-monolayers of Ni on a Pd substrate.

Time-dependent investigation of sub-monolayers of Ni on Pd using Positron-annihilation induced Auger Electron Spectroscopy and XPS

The surface of a polycrystalline Pd-substrate covered with (sub-) monolayers of Ni was investigated with Positron-annihilation induced Auger Electron Spectroscopy (PAES). Comparative studies using conventional AES induced by electrons and X-rays showed the outstanding surface sensitivity of PAES. Time-dependent PAES was performed on a 0.5ML Ni cover layer on Pd and compared with conventional X-ray induced Photoelectron Spectroscopy (XPS) in order to observe changes in the elemental composition of the surface. The PAES results appear to show a migration of Ni atoms into the Pd substrate, whereas the Ni signal shows a decrease of 12% within 13h with respect to the initial value.

PAES: Positron annihilation induced Auger electron spectrometer

Positron annihilation induced Auger electron spectroscopy (PAES) is a newly developed application for surface studies with high elemental selectivity and exceptional surface sensitivity. The instrument is operated by the Technische Universität München and is located at NEPOMUC.

Upgrade of the Surface Spectrometer at NEPOMUC for PAES, XPS and STM Investigations

The characterization of the elemental composition of surfaces is of great importance for the understanding of many surface processes, such as surface segregation or oxidation. Positron-annihilation-induced Auger Electron Spectroscopy (PAES) is a powerful technique for gathering information about the elemental composition of only the topmost atomic layer of a sample. The upgraded surface spectrometer at NEPOMUC (NEtron induced POsitron source MUniCh) enables a comprehensive surface analysis with the complementary techniques STM, XPS and PAES. A new X-ray source for X-ray induced photoelectron spectroscopy (XPS) was installed to gather additional information on oxidation states. A new scanning tunneling microscope (STM) is used as a complementary method to investigate with atomic resolution the surface electron density. The combination of PAES, XPS and STM allows the characterization of both the elemental composition, and the surface topology.

Surface states and annihilation characteristics of positrons trapped at the oxidized Cu(100) surface

In this work we present the results of theoretical studies of positron surface and bulk states and annihilation probabilities of surface-trapped positrons with relevant core electrons at the oxidized Cu(100) surface under conditions of high oxygen coverage. Oxidation of the Cu(100) surface has been studied by performing an ab-initio investigation of the stability and electronic structure of the Cu(100) missing row reconstructed surface at various on-surface and subsurface oxygen coverages ranging from 0.5 to 1.5 monolayers using density functional theory (DFT). All studied structures have been found to be energetically more favorable as compared to structures formed by purely on-surface oxygen adsorption. The observed decrease in the positron work function when oxygen atoms occupy on-surface and subsurface sites has been attributed to a significant charge redistribution within the first two layers, buckling effects within each layer and an interlayer expansion. The computed positron binding energy, positron surface state wave function, and annihilation probabilities of the surface trapped positrons with relevant core electrons demonstrate their sensitivity to oxygen coverage, atomic structure of the topmost layers of surfaces, and charge transfer effects. Theoretical results are compared with experimental data obtained from studies of oxidation of the Cu(100) surface using positron annihilation induced Auger electron spectroscopy (PAES). The results presented provide an explanation for the changes observed in the probability of annihilation of surface trapped positrons with Cu 3p core-level electrons as a function of annealing temperature.

Predominance of multielectron processes contributing to the intrinsic spectra of low-energy Auger transitions in copper and gold

Positron-annihilation-induced Auger electron spectroscopy (PAES) was used to obtain Cu and Au Auger spectra that are free of primary-beam-induced backgrounds by impinging the positrons at an energy below the secondary-electron-emission threshold. The removal of the core electron via annihilation in the PAES process resulted in the elimination of postcollision effects. The spectra indicate that there is an intense low-energy tail (LET) associated with the Auger peak that extends all the way to 0 eV. The LET is interpreted as indicative of processes in which filling of the core hole by a valence electron results in the ejection of two or more valence electrons which share the energy of the conventional core-valence-valence Auger electron.

Direct Observation of the Surface Segregation of Cu in Pd by Time-Resolved Positron-Annihilation-Induced Auger Electron Spectroscopy

Density functional theory calculations predict the surface segregation of Cu in the second atomic layer of Pd which has not been unambiguously confirmed by experiment so far. We report measurements on Pd surfaces covered with three and six monolayers of Cu using element selective positron-annihilation-induced Auger electron spectroscopy (PAES) which is sensitive to the topmost atomic layer. Moreover, time-resolved PAES, which was applied for the first time, enables the investigation of the dynamics of surface atoms and hence the observation of the segregation process. The time constant for segregation was experimentally determined to τ=1.38(0.21) h, and the final segregated configuration was found to be consistent with calculations. Time-dependent PAES is demonstrated to be a novel element selective technique applicable for the investigation of, e.g., heterogeneous catalysis, corrosion, or surface alloying.

High resolution positron annihilation induced Auger electron spectroscopy of the CuM 2,3VV-transition and of Cu sub-monolayers on Pd and Fe

We present a high resolution positron annihilation induced Auger Electron Spectroscopy (PAES) of the CuM 2,3VV-transition with the unprecedented energy resolution of Δ E E < 1 % . This energy resolution and the highly intense positron source NEPOMUC enabled us to resolve the double peak structure with PAES for the first time within a measurement time of only 5.5 h. In addition, sub-monolayers of Cu were deposited on Fe- and Pd-samples in order to investigate the surface selectivity of PAES in comparison with EAES. The extremely high surface selectivity of PAES due to the different positron affinity of Cu and Fe lead to the result that with only 0.96 monolayer of Cu on Fe more than 55% of the emitted Auger electrons stem from Cu, whereas with EAES the Cu Auger fraction amounted to less than 6%.

High-resolution Auger-electron spectroscopy induced by positron annihilation on Fe, Ni, Cu, Zn, Pd, and Au

Positron annihilation induced Auger electron spectroscopy (PAES) enables almost background free, non-destructive surface analysis with high surface selectivity. The Auger-spectrometer at the high intense positron source NEPOMUC now allows to record positron annihilation induced Auger spectra within a short data acquisition time of 10-80 minutes. With a new hemispherical electron energy analyzer and due to the exceptional peak to noise ratio, we succeeded to measure Auger-transitions such as the M2,3V V double peak of nickel with high energy resolution. The relative Auger-electron intensities are obtained by the analysis of the recorded positron annihilation induced Auger spectra for the surfaces of Fe, Ni, Cu, Pd and Au. It is demonstrated, that high-resolution PAES allows to determine experimentally the relative surface core annihilation probability of various atomic levels.

Oxidation and thermal reduction of the Cu(1 0 0) surface as studied using positron annihilation induced Auger electron spectroscopy (PAES)

Changes in the surface of an oxidized Cu(1 0 0) single crystal resulting from vacuum annealing have been investigated using positron annihilation induced Auger electron spectroscopy (PAES). PAES measurements show a large increase in the intensity of the annihilation induced Cu M 2,3VV Auger peak as the sample is subjected to a series of isochronal anneals in vacuum up to annealing temperature 300 °C. The intensity then decreases monotonically as the annealing temperature is increased to ∼600 °C. Experimental probabilities of annihilation of surface-trapped positrons with Cu 3p and O 1s core-level electrons are estimated from the measured intensities of the positron annihilation induced Cu M 2,3VV and O KLL Auger transitions. Experimental PAES results are analyzed by performing calculations of positron surface states and annihilation probabilities of surface-trapped positrons with relevant core electrons taking into account the charge redistribution at the surface, surface reconstructions, and electron–positron correlations effects. The effects of oxygen adsorption on localization of positron surface state wave function and annihilation characteristics are also analyzed. Possible explanation is proposed for the observed behavior of the intensity of positron annihilation induced Cu M 2,3VV and O KLL Auger peaks and probabilities of annihilation of surface-trapped positrons with Cu 3p and O 1s core-level electrons with changes of the annealing temperature.

양전자 소멸 Auger 전자 에너지 측정을 위한 Time of Flight의 분해도 향상에 관한 이론적 연구

저에너지(수 eV) 양전자 빔을 이용하여 도체나 반도체의 표면/계면의 물리화학적 특성 분석에 독특한 유용성이 보고 되고 있다. 기존의 표면 분석법에 비해 표면의 선택도가 향상되어 반도체 소자의 박막 두께가 얇아지는 최신기술에 적합한 분석법으로 주목을 받고 있다. 물질표면에 조사된 저에너지 양전자는 표면 근처의 image potential에 포획이 되어 표면에 있는 전자들과 쌍소멸하며 Auger 전자를 방출한다. 표면으로부터 방출된 Auger 전자의 에너지를 측정함으로 원자의 화학적 구별이 가능하므로 검출기의 에너지 분해도가 중요하다. 기존의 ExB 형태의 에너지 측정기는 분해도가 <TEX>$6{\sim}10\;eV$</TEX> 정도이고 특정한 에너지 영역만을 일정시간 스캔하여 스펙트럼을 측정하므로 측정시간이 길어진다는 단점이 있다. 반면에 Time-Of-Flight(TOF) 시스템은 방출되는 전자들의 에너지를 동시에 검출하므로 측정시간이 단축되어 측정 효율이 향상된다. 에너지 분해도를 높이기 위해서는 측정하고자 하는 전자의 진행거리를 길게 할수록 좋으나, 공간적 제약을 고려한 reflected TOF 시스템과 retarding tube을 이용한 linear TOF 시스템의 에너지 분해도를 이론적으로 시뮬레이션하였다. Since the presence of the chemical impurities and defect at surfaces and interfaces greatly influence the properties of various semiconductor devices, an unambiguous chemical characterization of the metal and semiconductor surfaces become more important in the view of the miniaturization of the devices toward nano scale. Among the various conventional surface characterization tools, Electron-induced Auger Electron Spectroscopy (EAES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Electron Ion Mass Spectroscopy (SIMS) are being used for the identification of the surface chemical impurities. Recently, a novel surface characterizaion technique, Positron-annihilation induced Auger Electron Spectroscopy (PAES) is introduced to provide a unique method for the analysis of the elemental composition of the top-most atomic layer. In PAES, monoenergetic positron of a few eV are implanted to the surface under study and these positrons become thermalized near the surface. A fraction of the thermalized positron trapped at the surface state annihilate with the neighboring core-level electrons, creating core-hole excitations, which initiate the Auger process with the emission of Auger electrons almost simultaneously with the emission of annihilating gamma-rays. The energy of electrons is generally determined by employing ExB energy selector, which shows a poor resolution of <TEX>$6{\sim}10eV$</TEX>. In this paper, time-of-flight system is employed to measure the electrons energy with an enhanced energy resolution. The experimental result is compared with simulation results in the case of both linear (with retarding tube) and reflected TOF systems.

Study of the surface contamination of copper with the improved positron annihilation-induced Auger electron spectrometer at NEPOMUC

The high intensity positron source NEPOMUC at the FRM-II in Munich enables measurement times for positron annihilation-induced Auger electron spectroscopy (PAES) of only 2.4 h/spectrum, in contrast to usual lab beams with measurement times up to several days. The high electron background due to surrounding experiments in the experimental hall of the FRM-II has been eliminated and hence background free experiments have become possible. Due to this, the signal to noise ratio has been enhanced to 4.5:1, compared to 1:3 with EAES. In addition, a long-term measurement has been performed in order to observe the contamination of a polycrystalline copper foil at 150 °C.

Study of cuprous oxide using time of flight positron annihilation induced Auger electron spectroscopy

AbstractChanges in the surface of copper (I) oxide resulting from vacuum annealing and reoxidation after vacuum annealing have been investigated using positron annihilation induced Auger electron spectroscopy (PAES). The PAES measurement shows a large monotonic increase in the intensity of the annihilation induced Cu (M2,3 VV) Auger peak as the sample is subjected to thermal anneal in the vacuum at 300 °C temperature for 13 minutes. Exposure of the vacuum annealed surface to oxygen resulted in a large reduction of Cu (M2,3 VV) intensity and an increase in the signal due to the KLL transition in O. These results provide a clear demonstration of the utility of PAES in the study of oxide surfaces. (© 2007 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)

Surface investigation of Si(1 0 0), Cu, Cu on Si(1 0 0), and Au on Cu with positron annihilation induced Auger-electron spectroscopy

The surfaces of polycrystalline Cu, Au-coated Cu, Si(1 0 0) and of Si(1 0 0) coated with 1.5 monolayer Cu were investigated with positron annihilation induced Auger-electron spectroscopy (PAES). Since the electron background has been reduced considerably we observed the Cu M 2,3VV-Auger transition on a copper surface within only three hours which is the shortest acquisition time reported so far for PAES. In order to demonstrate PAES’ high potential the Auger-yield, the signal-to-background ratio as well as the surface selectivity were compared with accompanying EAES-measurements quantitatively. A more efficient electron energy analyzer for the present PAES setup would lead to an additional efficiency gain of more than two orders of magnitude. The presented measurements were performed at the low-energy positron beam of high intensity NEPOMUC at the research reactor FRM II.

Positron probes of the Ge(1 0 0) surface: The effects of surface reconstructions and electron–positron correlations on positron trapping and annihilation characteristics

Positron annihilation induced Auger electron spectroscopy (PAES) has been applied to study the Ge(100) surface. The high-resolution PAES spectrum from the Ge(100) surface displays several strong Auger peaks corresponding to M4,5N1N2,3, M2,3M4,5M4,5, M2,3M4,5V and M1M4,5M4,5 Auger transitions. The integrated peak intensities of Auger transitions are used to obtain experimental annihilation probabilities for the Ge 3d and 3p core level electrons. These experimental results are analyzed by performing calculations of positron surface states and annihilation characteristics of surface trapped positrons with relevant Ge core-level electrons for the non-reconstructed and reconstructed Ge(100)-p(2×1), Ge(100)-p(2×2) and Ge(100)-c(4×2) surfaces. It is found that the positron surface state wave function extends into the Ge lattice in the regions where atoms are displaced from their ideal terminated positions due to reconstructions. Estimates of the positron binding energy and the positron annihilation characteristics reveal their sensitivity to the specific atomic structure of the topmost layers of Ge(100). A comparison with PAES data reveals an agreement with theoretical core annihilation probabilities for the Auger transitions considered.

Novel time-of-flight spectrometer for the analysis of positron annihilation induced Auger electrons

Positron annihilation induced Auger-electron spectroscopy (PAES) has several advantages over conventional Auger-electron spectroscopy such as extremely high surface sensitivity and outstanding signal-to-noise ratio at the Auger-transition energy. In order to benefit from these prominent features a low-energy positron beam of high intensity is required for surface sensitive PAES studies. In addition, an electron energy analyzer is required, which efficiently detects the Auger electrons with acceptable energy resolution. For this reason a novel time-of-flight (TOF) spectrometer has been developed at the intense positron source NEPOMUC that allows PAES studies within short measurement time. This TOF-PAES setup combines a trochoidal filter and a flight tube in a Faraday cage in order to achieve an improved energy resolution of about 1eV at high electron energies up to E≈1000eV. The electron flight time is the time between the annihilation radiation at the sample and when the electron hits a microchannel plate detector at the end of the flight tube.