A dual-channel attenuation measurement system has been developed to measure the dielectric properties of low-permittivity and low-loss homogenous materials. The scattering parameters are derived from a series of transmission measurements, which were performed under different reflection coefficients of the source and load ports set by a pair of automatic tuners. The reflection coefficients of the automatic tuners were calibrated with the vector network analyzer (VNA) before the measurements. The mismatch error is effectively eliminated with the measurement and calculation process. The measurement scattering parameters are of much smaller uncertainties than those with the VNA. A polyimide aerogel sample is measured at X-band frequencies, its permittivity is about 1.075, and the loss tangent is about 0.001. The corresponding standard uncertainties are 0.0014 and 0.00048, respectively. The uncertainty of the loss tangent is reduced by one order compared to the results based on VNA. For validation of the proposed method, measurements of two polytetrafluoroethylene (PTFE) samples with different thicknesses were also conducted. This paper provides a broadband method for dielectric characterization with improved accuracy for low-permittivity and low-loss materials and can easily be extended to other waveguide bands.
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