Journal Article A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution Get access Tomáš Hrnčíř, Tomáš Hrnčíř TESCAN Brno s.r.o, Brno, Jihomoravsky kraj, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Dušan Nešpor, Dušan Nešpor TESCAN Brno s.r.o, Brno, Jihomoravsky kraj, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Zsolt Radi, Zsolt Radi TESCAN Brno s.r.o, Brno, Jihomoravsky kraj, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Jaroslav Jiruše, Jaroslav Jiruše TESCAN Brno s.r.o, Brno, Jihomoravsky kraj, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Lukáš Hladík, Lukáš Hladík TESCAN ORSAY HOLDING, a.s., Brno, Jihomoravsky kraj, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Olivier Salord, Olivier Salord Orsay Physics, Fuveau, Provence-Alpes-Cote d'Azur, France Search for other works by this author on: Oxford Academic Google Scholar Anne Delobbe Anne Delobbe Orsay Physics, Fuveau, Provence-Alpes-Cote d'Azur, France Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 412–413, https://doi.org/10.1017/S1431927620014580 Published: 01 August 2020
Read full abstract