Journal Article Radiation Damage on Liquid Electrolyte during Spatially Resolved Soft X-ray Photoemission Measurements Get access Christopher Arble, Christopher Arble Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States Corresponding author: christopher.arble@nist.gov and andrei.kolmakov@nist.gov Search for other works by this author on: Oxford Academic Google Scholar Hongxuan Guo, Hongxuan Guo SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, P. R. China Search for other works by this author on: Oxford Academic Google Scholar Brian Hoskins, Brian Hoskins Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States Search for other works by this author on: Oxford Academic Google Scholar Matteo Amati, Matteo Amati Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy Search for other works by this author on: Oxford Academic Google Scholar Patrick Zeller, Patrick Zeller Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy Search for other works by this author on: Oxford Academic Google Scholar Luca Gregoratti, Luca Gregoratti Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy Search for other works by this author on: Oxford Academic Google Scholar Andrei Kolmakov Andrei Kolmakov Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States Corresponding author: christopher.arble@nist.gov and andrei.kolmakov@nist.gov Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 730–731, https://doi.org/10.1017/S1431927619004380 Published: 01 August 2019