Zinc oxide (ZnO) nanorods were grown on rigid substrate (fluorine doped tin oxide, FTO) with different molar concentrations (0.025, 0.075 and 0.125 M) using a low-temperature hydrothermal process. The XRD analysis revealed the formation of hexagonal wurtzite structured ZnO nanorods with (002) plane c-axis orientation of the samples. Morphological analysis by the FESEM method confirmed the formation of ZnO nanorods with hexagonal top surfaces. The electrical properties of the fabricated devices were identified using photoconductivity and impedance studies. Less internal resistance of 1.12 kΩ, turn on the voltage of 0.46 V for 0.075 M sample depicted better piezoelectric property. At 9 Hz resonant frequency, a maximum voltage of 2.13 V and for 1 g acceleration input, the output voltage obtained was 2.49 V for 0.075 M sample which is better than the other two precursors molar concentration varied samples (0.025 and 0.125 M). The sensitivity of this sample was found to be ∼3.05 V/g.