Significant interlayer transmission obstacles and numerous interface barriers in two-dimensional material thin films impede charge transfer, degrading device performance. However, appropriate impurity ions can enhance charge mobility by creating transfer channels and regulating interface defect states. Herein, a series of Bi2O2SxSe1-x films were prepared by a one-step hydrothermal sulfurization method. The XRD and XPS measurement and analysis can confirm that the Se atoms have been replaced by the S atoms. The introduction of S atoms can effectively enhance the number of defects in Bi2O2Se, resulting in an increase in carrier concentration, thereby improving the conductivity of Bi2O2Se film. The photoconductive detectors fabricated from these Bi2O2SxSe1-x films showed improved detection performance compared to those made from the pristine Bi2O2Se film, and the responsivity is increased by nearly 1000 times. Notably, the detector based on Bi2O2S0.37Se0.63 film has high responsivity (47.7 mA/W) and fast response time (15 ms/25 ms). The simple thin film preparation method and good device performance make it have great potential for large-scale preparation.
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