Titanite CaTiSiO5 (CTS) is considered to be a promising dielectric material for preparing high-voltage multilayer ceramic capacitors because it exhibits a positive bias dependence of the dielectric permittivity due to its antipolar crystal structure. In this study, we investigated the dielectric response and breakdown strength of CaTiGeO5 (CTG), a structural analog of CTS, inspired by its higher low-field dielectric permittivity. Particular attention was paid to the sintering temperature to reveal the effect of the microstructure and loss of volatile Ge on the electrical properties of CTG. Dense CTG ceramics with relative densities above 97 % and grain sizes between 1.3 and 3.4 μm were obtained through a conventional solid-state reaction route at sintering temperatures between 1150 and 1250 °C. A secondary phase of CaTiO3 was formed in the ceramics sintered at 1200 and 1250 °C due to Ge loss, but this phase was easily removed by surface polishing alone. The sintering temperature largely affected the dielectric breakdown strength through microstructural development, resulting in the highest breakdown strength of 1190 kV cm−1 for a sample sintered at 1200 °C, while it did not change the low-field dielectric properties of the samples. Furthermore, the sample retained high breakdown strength of >900 kV cm−1 at elevated temperatures up to 150 °C and exhibited a nonlinear polarization response, resulting in the positive electric field dependence of the dielectric permittivity.