Organic Solderability Preservative Surface Finish Research Articles

Fatigue performance and microstructure of lead-free solder joints in BGA assembly at room temperature

One of the crucial factors in evaluating the reliability of an electronic appliance is fatigue failure of the interconnecting solder joints. In most situations, large bulk samples are used to investigate the fatigue characteristics of the solder materials. Only a few studies have examined the solder joints frequently observed in ball grid array (BGA) components. This study implemented a specialized test vehicle in BGA assembly connecting two substrates with nine identical solder joints. Four SAC-based solder alloys were tested using an Instron micromechanical tester in the stress-controlled and strain-controlled methods at room temperature and constant strain rate. At two distinctive stress and strain levels, the fatigue performance of alloys featuring organic solderability preservative (OSP) and electroless nickel-immersion gold (ENIG) surface finishes was investigated. The fatigue results obtained from the stress-controlled and strain-controlled tests were compared. Microstructural analysis was performed using scanning Electron Microscopy (SEM) and energy dispersive spectroscopy (EDS) to identify the precipitates in the bulk solder and the morphologies of IMC layers. The thickness of intermetallic compound (IMC) layers and the failure mode were examined in each case. The results demonstrated that the OSP surface finish significantly outperformed the ENIG surface finish regardless of the testing process and solder alloy. Various failure modes were observed, depending on the solder alloy and IMC layer.

Effect of temperature on the low cycle fatigue properties of BGA solder joints

Since the restriction of hazardous substances (RoHS) directive, lead-free soldering has been widely broad adopted. In many applications, lead-free alloys have been substituted for conventional SnPb (Tin-Lead) solder. Among lead-free alloys, SAC305(Sn-3.0Ag-0.5Cu) has gained the highest acceptance as a solder alloy. The fatigue performance of solder joints has become an essential reliability assessment criterion due to the transition to more reliable lead-free alloys from highly predictable lead-based alloys. This study examines the shear fatigue characteristics of sandwich test vehicles for SnPb and SAC305 at different temperatures using both Organic Solderability Preservative (OSP) and Electroless Nickel-Immersion Silver (ENIG) surface finishes. The fatigue experiments were performed using an Instron micromechanical tester at a constant strain rate, and microstructural analysis was carried out using Scanning Electron Microscopy (SEM) to identify the Intermetallic Compound (IMC) morphology and failure mode. The stress-strain (hysteresis) loops of SnPb and SAC305 were measured, and the fatigue life of the specimens was estimated using the strain-life equation at various temperatures. SAC305 was observed to have a better fatigue life than SnPb, particularly at higher strain levels or testing temperatures. The OSP surface finish demonstrated superior fatigue properties compared to the ENIG surface finish. Additionally, elevated testing temperatures were found to accelerate fatigue failure in solder joints. The Arrhenius model was utilized to develop a general empirical model that predicts the fatigue life of SAC305 and SnPb solder alloys with OSP and ENIG surface finishes as a function of the strain level and testing temperature.

Performance of Sn-3.0Ag-0.5Cu Composite Solder with Kaolin Geopolymer Ceramic Reinforcement on Microstructure and Mechanical Properties under Isothermal Ageing.

This paper elucidates the effect of isothermal ageing at temperature of 85 °C, 125 °C and 150 °C for 100, 500 and 1000 h on Sn-3.0Ag-0.5Cu (SAC305) lead-free solder with the addition of 1 wt% kaolin geopolymer ceramic (KGC) reinforcement particles. SAC305-KGC composite solders were fabricated through powder metallurgy using a hybrid microwave sintering method and reflowed on copper substrate printed circuit board with an organic solderability preservative surface finish. The results revealed that, the addition of KGC was beneficial in improving the total thickness of interfacial intermetallic compound (IMC) layer. At higher isothermal ageing of 150 °C and 1000 h, the IMC layer in SAC305-KGC composite solder was towards a planar-type morphology. Moreover, the growth of total interfacial IMC layer and Cu3Sn layer during isothermal ageing was found to be controlled by bulk diffusion and grain-boundary process, respectively. The activation energy possessed by SAC305-KGC composite solder for total interfacial IMC layer and Cu3Sn IMC was 74 kJ/mol and 104 kJ/mol, respectively. Based on a lap shear test, the shear strength of SAC305-KGC composite solder exhibited higher shear strength than non-reinforced SAC305 solder. Meanwhile, the solder joints failure mode after shear testing was a combination of brittle and ductile modes at higher ageing temperature and time for SAC305-KGC composite solder.

Effect of Ni(P) thickness in Au/Pd/Ni(P) surface finish on the electrical reliability of Sn–3.0Ag–0.5Cu solder joints during current-stressing

The effects of Ni(P) layer thickness (5 μm and 0.7 μm) on the microstructural behavior and electrical reliability of electroless-nickel electroless-palladium immersion gold (ENEPIG) (substrate-side) surface-finished printed circuit boards (PCBs) with Sn–3.0Ag–0.5Cu (SAC305) solder joints under current stressing of 9000 A/cm2 have been investigated. An organic solderability preservative (OSP) surface finish was applied on the chip-side. (Cu,Ni)6Sn5 and Cu6Sn5 intermetallic compound (IMC) layers were formed on the chip-side (the interface between SAC305 and the OSP surface finish) and substrate-side (the interface between the ENEPIG surface finish and SAC305) solder joints after reflow. The thicknesses of the (Cu,Ni)6Sn5 and Cu6Sn5 IMC layers of the chip- and substrate-side of the normal- and thin-ENEPIG/SAC305/OSP solder joints increased with increasing current stressing time, regardless of the nickel phosphorous (Ni(P)) layer thickness. The total IMC thicknesses of normal-ENEPIG/SAC305/OSP solder joints were relatively thinner than those of thin-ENEPIG/SAC305/OSP solder joints under current stressing for 50–120 h. This is the reason why only a P-rich Ni layer was formed at the interface between SAC305 solder and the Cu pad in the thin-ENEPIG/SAC305 solder joints under current stressing. Otherwise, the P-rich Ni and Ni(P) layers remained at the interface of the normal-ENEPIG/SAC305 solder joint under current stressing. The Ni(P) layer of the ENEPIG surface finish played an important diffusion barrier role by suppressing IMC growth and movement toward the SAC305 solder under current stressing. In the electrical evaluation, the time to failure at the normal-ENEPIG solder joint was relatively longer (approximately 2.2 times) than that of the thin-ENEPIG solder joint. Therefore, the relatively thick Ni(P) layer contained in the ENEPIG/SAC305/OSP solder joint is expected to attain higher electrical reliability under the electromigration test.

Electromigration Behavior of Cu Core Solder Joints Under High Current Density

Cu core solder ball (CCSB) is formed by a Cu core surrounded by solder alloy and is used as an interconnection material for 3D packaging. Herein, the electromigration behavior of CCSBs with an organic solderability preservative surface finish is compared with that of Sn–3.0Ag–0.5Cu (SAC) solder joint. The current density and temperature for electromigration test are 0.9 × 104 A/cm2 and 100 °C, which are in compliance with JEP154. The current density of the solder joint is analyzed using finite element method analysis and maximum current density of the SAC solder joint is 1.1 times higher than the CCSB solder joint. The CCSB solder joint is less affected by the current crowding effect because electrons move through the Cu core located at the center of the solder. A void form in the Cu electrode of the cathode that coincides with the simulated maximum current area of the solder joint. The electromigration reliability of the CCSB solder joint is superior to that of the SAC solder joint.

Mechanical Reliability of Epoxy Sn–58wt.%Bi Composite Solder Under Temperature-Humidity Treatment with Organic Solderability Preservatives (OSP) Surface Finish

The microstructures and mechanical reliability of Sn–58Bi solder and epoxy Sn–58Bi composite solder joint were investigated with organic solderability preservative surface finishes. The mechanical reliabilities of Sn58Bi and epoxy Sn58Bi solder were evaluated by the board-level drop test and the 3-point bend test after temperature-humidity storage testing. The microstructure and chemical composition of the solder joints were characterized by scanning electron microscopy and energy dispersive X-ray spectroscopy, respectively. The addition of epoxy in solder paste did not affect the morphology of the intermetallic compound. The thickness of the scalloped-shaped Cu6Sn5 intermetallic compound of solder/OSP joint increased with aging time. The drop number until fail for the epoxy Sn58Bi/OSP joint was higher than that for the Sn–58Bi/OSP joint; the average numbers of drops withstood by the Sn–58Bi/OSP joint and epoxy Sn–58Bi/OSP joint following the reflow process were fewer than 10 drops and 180 drops, respectively. The drop number of solder/OSP joints decreased with increasing aging time. The result of the 3-point bend tests shows that the number of bend cycles for the epoxy Sn–58Bi/OSP joint was 30 times higher than that for the Sn–58Bi/OSP joint. The number of bend cycles for solder/OSP joints was decreased with increasing aging time.

Effects of Surface Finish on the Shear Fatigue of SAC-Based Solder Alloys

Solder joints in electronic assemblies are subjected to mechanical cycling in normal operating conditions. Testing individual solder joint in mechanical cycling allows monitoring the evolution of hysteresis loop with time and provides the ability to study the factors that affect the reliability. In this article, the effect of surface finish on the fatigue behaviors of four doped lead-free solder alloys (CycloMax, Innolot, Ecolloy, and SAC-X-Plus) and SAC305 was investigated. Individual solder joints with three surface finishes [organic solderability preservative (OSP), immersion silver (ImAg), and electroless nickel immersion gold (ENIG)] were prepared and subjected to various cyclic shear stress loadings until complete failure. Hysteresis loop was systematically recorded using an Instron machine. Characteristic fatigue life and energy dissipation per cycle were analyzed, and the Morrow energy model was applied to empirically predict the fatigue life as a function of work dissipation. Failure mechanisms were investigated as well using SEM/EDS, and the results were correlated with the fatigue behavior of the solder joints. The results indicated that the fatigue resistance of the solder alloys decreased with the increase in stress amplitude. The fatigue resistance of the solder joints with OSP and ImAg surface finishes outperformed ENIG surface finish. CycloMax with OSP surface finish was associated with the best fatigue resistance, while SAC-X-Plus with ENIG surface finish was associated with the worst fatigue resistance. Three failure modes were detected in this study: ductile, brittle, and near-intermetallic compound (IMC) failure. It was also found that Innolot with ENIG surface finish is more susceptible to brittle failure because of the excessive brittleness associated with this alloy.

Effect of Epoxy on Mechanical Property of SAC305 Solder Joint with Various Surface Finishes Under 3-Point Bend Test.

Microstructures and mechanical property of Sn-3.0Ag-0.5Cu (SAC305) and epoxy Sn-3.0Ag-0.5Cu (epoxy SAC) solder joints were investigated with various surface finishes; organic solderability preservative (OSP), electroless nickel immersion gold (ENIG) and electroless nickel electroless palladium immersion gold (ENEPIG). Bending property of solder joints was evaluated by 3-point bend test method. Microstructure and chemical composition of solder joints was characterized by scanning electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDX), respectively. Epoxy did not effect on intermetallic compound (IMC) morphology. Scalloped shaped Cu6Sn5 IMC was observed at OSP surface finish. Chunky-like shaped and needle-like shaped (Ni,Cu)6Sn5 IMC were observed at the solder/ENIG joint and solder/ENEPIG joint, respectively. The bending cycles of SAC305/OSP joint, SAC305/ENIG joints and SAC305/ENEPIG joints were 720, 440 and 481 cycle numbers. The bending cycles of epoxy SAC and three types surface finished solder joints were over 1000 bending cycles. Under OSP surface finish, bending cycles of epoxy SAC solder was approximately 1.5 times higher than those of SAC305 solder joint. Bending cycles of epoxy SAC solder was over twice times higher than those of SAC305 solder with ENIG and ENEPIG surface finishes. The bending property of epoxy solder joint was enhanced due to epoxy fillet held the solder joint.

Evaluation of the Long-Term Reliability of the Epoxy-Contained SAC305 Solder with Organic Solderability Preservative Surface Finish

Evaluation of the Long-Term Reliability of the Epoxy-Contained SAC305 Solder with Organic Solderability Preservative Surface Finish

Effect of Plasma Surface Finish on Wettability and Mechanical Properties of SAC305 Solder Joints

The wetting behavior, interfacial reactions, and mechanical reliability of Sn-Ag-Cu solder on a plasma-coated printed circuit board (PCB) substrate were evaluated under multiple heat-treatments. Conventional organic solderability preservative (OSP) finished PCBs were used as a reference. The plasma process created a dense and highly cross-linked polymer coating on the Cu substrates. The plasma finished samples had higher wetting forces and shorter zero-cross times than those with OSP surface finish. The OSP sample was degraded after sequential multiple heat treatments and reflow processes, whereas the solderability of the plasma finished sample was retained after multiple heat treatments. After the soldering process, similar microstructures were observed at the interfaces of the two solder joints, where the development of intermetallic compounds was observed. From ball shear tests, it was found that the shear force for the plasma substrate was consistently higher than that for the OSP substrate. Deterioration of the OSP surface finish was observed after multiple heat treatments. Overall, the plasma surface finish was superior to the conventional OSP finish with respect to wettability and joint reliability, indicating that it is a suitable material for the fabrication of complex electronic devices.

Solder Ball Attach With Water Soluble Air Reflowable Tacky Fluxes

Selected physical properties of four water-soluble tacky fluxes were measured, including viscosity, acid number, pH, weight loss during heating, and rheological properties. The capability of the fluxes to perform ball attach in air and N2 using an in-house test board with Cu–organic solderability preservative surface finish was studied in a Malcom reflow simulator using highly oxidized SAC305 solder spheres. Flux performance was rated from the observations of fluxing action in a reflow simulator and the ability to realign deliberately misplaced solder balls and eliminate the occurrence of crescent defects. Two of the four fluxes exhibited good ability to realign misplaced solder balls and one flux exhibited outstanding ease of cleaning. Contrary to common perception, the best performing flux did not have the highest acid number.

Effects of PCB ENIG and OSP Surface Finishes on the Electromigration Reliability and Shear Strength of Sn-3.5Ag PB-Free Solder Bump

The effects of printed circuit board electroless nickel immersion gold (ENIG) and organic solderability preservative (OSP) surface finishes on the electromigration reliability and shear strength of Sn-3.5Ag Pb-free solder bump were systematically investigated. In-situ annealing tests were performed in a scanning electron microscope chamber at 130, 150, and <TEX>$170^{\circ}C$</TEX> in order to investigate the growth kinetics of intermetallic compound (IMC). Electromigration lifetime and failure modes were investigated at <TEX>$150^{\circ}C$</TEX> and <TEX>$1.5{\times}10^5A/cm^2$</TEX>, while ball shear tests and failure mode analysis were conducted under the high-speed conditions from 10 mm/s to 3000 mm/s. The activation energy of ENIG and OSP surface finishes during annealing were evaluated as 0.84 eV and 0.94 eV, respectively. The solder bumps with ENIG surface finish showed longer electromigration lifetime than OSP surface finish. Shear strengths between ENIG and OSP were similar, and the shear energies decreased with increasing shear speed. Failure analysis showed that electrical and mechanical reliabilities were very closely related to the interfacial IMC stabilities.

OSP 표면처리의 열적 열화에 따른 Cu/SnAgCu 접합부의 접합강도

Bonding strength of Sn-3.0Ag-0.5Cu solder joint due to degradation characteristic of OSP surface finish was investigated, compared with SnPb finish. The thickness variation and degradation mechanism of organic solderability preservative(OSP) coating were also analyzed with the number of reflow process. To analyze the degradation degree of solder joint strength, FR-4 PCB coated with OSP and SnPb were experienced preheat treatment as a function of reflow number from 1st to 6th pass, respectively. After 2012 chip resistors were soldered with Sn-3.0Ag-0.5Cu on the pre-heated PCB, the shear strength of solder joints was measured. The thickness of OSP increased with increase of the number of reflow pass by thermal degradation during the reflow process. It was also observed that the preservation effect of OSP decreased due to OSP degradation which led Cu pad oxidation. The mean shear strength of solder joints formed on the Cu pads finished with OSP and SnPb were 58.1 N and 62.2 N, respectively, through the pre-heating of 6 times. Although OSP was degraded with reflow process, the feasibility of its application was proven.

Morphology and Growth of Intermetallics at the Interface of Sn-based Solders and Cu with Different Surface Finishes

Several types of surface finishes have been applied on Cu substrates in an effort to facilitate bonding and improve the reliability of lead-free solder joints. In the current research, the effects of printed circuit board surface finishes on the reliability of the solder joints were investigated by examining the morphology and growth behavior of the intermetallic compounds (IMCs) between Sn-based solders and different surface finishes on Cu. Three types of Cu substrates with different surface finishes were fabricated in this study: organic solderability preservative (OSP)/Cu, Ni/Cu, and electroless nickel immersion gold (ENIG)/Cu. Sn-3.5Ag and Sn-3.0Ag-0.5Cu were used as the solders. In the experiment, the solder joint specimens were aged isothermally at 150°C for up to 1000 h. Experimental results revealed that the OSP surface finish promoted the interdiffusion between Cu and Sn during soldering. The composition and morphology of the IMC layer at the solder/Ni/Cu interface were sensitive to the Cu concentration in the solder. Meanwhile, the solder joints with different morphological features of the IMCs exhibited significant differences in shear strengths. The Au-containing ENIG surface finish affected the shear strength of the solder joint significantly at the initial stage of isothermal aging.

Failure Analysis of Lead-Free Solder Joints of an 1657CCGA (Ceramic Column Grid Array) Package

In this study, failure analysis of the 1657CCGA package with 95.5wt%Sn3.9wt%Ag0.6wt%Cu and 63wt%Sn37wt%Pb solder pastes on lead-free PCBs with the Entek OSP (organic solderability preservative) surface finish is investigated. Emphasis is placed on determining the failure locations and failure modes of the solder joints of the 1657CCGA assemblies after they have been through 7,000 cycles of temperature cycling.