Organic Secondary Ion Mass Spectrometry Research Articles

Design and performance of a reflectron based time-of-flight secondary ion mass spectrometer with electrodynamic primary ion mass separation

In many secondary ion mass spectrometry (SIMS) investigations, the total number of generated secondary ions is limited by the amount of sample material available. This is the case in surface reaction studies as well as in organic and inorganic trace analysis or imaging SIMS. In such cases a time-of-flight mass spectrometer has some considerable advantages: quasisimultaneous detection of all masses, unlimited mass range, and very high transmission. We have developed a high-resolution reflectron based time-of-flight secondary ion mass spectrometer with a new electrodynamic mass separation and beam chopping technique based on a pulsed 90° deflection of the primary ion beam. A primary ion pulse width of less than 1.5 ns has been obtained. Second-order energy focusing in the flight path of the secondary ions is achieved by a two-stage reflectron. A mass resolution m/Δm=13 000 and a dynamic range of five orders of magnitude have been obtained with this instrument.

Modular instrument for organic secondary ion mass spectrometry and direct chromatographic analysis

A secondary ion mass spectrometer has been constructed for the analysis of organic samples introduced via a direct insertion probe and for the direct analysis of chromatographic samples. For discrete organic samples, a level of performance commensurate with commercial instruments has been established. Novel spatially resolved spectra for organic samples are presented, as well as the results of the direct sputtering of samples from a chromatographic matrix. The use of a matrix cycled through the solid/liquid phase transition for the in situ extraction of material is also described.

Protonation in organic secondary ion mass spectrometry: Correlation with solution chemistry involved in sample preparation

Protonation in organic secondary ion mass spectrometry: Correlation with solution chemistry involved in sample preparation

Organic secondary ion mass spectrometry (SIMS) and its relation to Fast Atom Bombardment (FAB)

Organic secondary ion mass spectrometry (SIMS) and its relation to Fast Atom Bombardment (FAB)

ChemInform Abstract: SECONDARY ION MASS SPECTROMETRY OF MOLECULAR SOLIDS. CLUSTER FORMATION DURING ION BOMBARDMENT OF FROZEN WATER, BENZENE, AND CYCLOHEXANE

Chemischer InformationsdienstVolume 10, Issue 31 Physical Organic Chemistry ChemInform Abstract: SECONDARY ION MASS SPECTROMETRY OF MOLECULAR SOLIDS. CLUSTER FORMATION DURING ION BOMBARDMENT OF FROZEN WATER, BENZENE, AND CYCLOHEXANE G. M. LANCASTER, G. M. LANCASTERSearch for more papers by this authorF. HONDA, F. HONDASearch for more papers by this authorY. FUKUDA, Y. FUKUDASearch for more papers by this authorJ. W. RABALAIS, J. W. RABALAISSearch for more papers by this author G. M. LANCASTER, G. M. LANCASTERSearch for more papers by this authorF. HONDA, F. HONDASearch for more papers by this authorY. FUKUDA, Y. FUKUDASearch for more papers by this authorJ. W. RABALAIS, J. W. RABALAISSearch for more papers by this author First published: July 31, 1979 https://doi.org/10.1002/chin.197931063AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume10, Issue31July 31, 1979 RelatedInformation