Abstract

A secondary ion mass spectrometer has been constructed for the analysis of organic samples introduced via a direct insertion probe and for the direct analysis of chromatographic samples. For discrete organic samples, a level of performance commensurate with commercial instruments has been established. Novel spatially resolved spectra for organic samples are presented, as well as the results of the direct sputtering of samples from a chromatographic matrix. The use of a matrix cycled through the solid/liquid phase transition for the in situ extraction of material is also described.

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