Number Of Reflow Cycles Research Articles

Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity

Ionic residues resulting from the soldering process is an important parameter in connection with humidity robustness of Printed Circuit Board Assemblies (PCBAs) due to their ability to enhance moisture absorption and surface conductivity. For reflow process, residues are trapped under the components, and the morphology of the residues can change with humidity exposure resulting in the release of ionic components. In this work, trapped residues below the components from reflow process of several commercial PCBAs were characterized before and after exposure to humidity conditions. PCBAs used for the analysis had undergone multiple reflow heating profiles by single and double reflow plus additional passes to understand heating effects. The morphology change of the trapped residues under components upon humidity exposure was observed using optical and scanning electron microscopy. The conductivity of the localized extracted solutions was measured and NaCl equivalency was determined. The solder paste materials were analysed for their water sorption property, while the effect of humidity on electrical property was assessed using electrochemical impedance spectroscopy using test PCBs. The results show that the change in morphology and level of activator release of residues were a function of the flux type, PCBA characteristics such as component standoff height and number of reflow cycles. Water layer formation upon humidity exposure and electrical properties on test PCBs are correlated with water sorption of the flux part.

Retained ratio of reinforcement in SAC305 composite solder joints: effect of reinforcement type, processing and reflow cycle

Purpose This paper aims to systematically study the effect of reinforcement type, processing methods and reflow cycle on actual retained ratio of foreign reinforcement added in solder joints. Design/methodology/approach Two kinds of composite solders based on SAC305 (wt.%) alloys with reinforcements of 1 wt.% Ni and 1 wt.% TiC nano-particles were produced using powder metallurgy and mechanical blending method. The morphology of prepared composite solder powder and solder pastes was examined; retained ratios of reinforcement (RRoR) added in solder joints after different reflow cycles were analysed quantitatively using an Inductively Coupled Plasma optical system (ICP-OES Varian-720). The existence forms of reinforcement added in solder alloys during different processing stages were studied using scanning electron microscope, X-ray diffractometry and energy dispersive spectrometry. Findings The obtained experimental results indicated that the RRoR in composite solder joints decreased with the increase in the number of reflow cycles, but a loss ratio diminished gradually. It was also found that the RRoR which could react with the solder alloy were higher than that of the one that are unable to react with the solder. In addition, compared with mechanical blending, the RRoRs in the composite solders prepared using power metallurgy were relatively pronounced. Originality/value Present study offer a preliminary understanding on actual content and existence form of reinforcement added in a reflowed solder joint, which would also provide practical implications for choosing reinforcement and adjusting processing parameters in the manufacture of composite solders.

Interfacial microstructure and hardness of nickel (Ni) nanoparticle-doped tin–silver–copper (Sn–Ag–Cu) solders on immersion silver (Ag)-plated copper (Cu) substrates

Sn–Ag–Cu composite solder has been prepared by adding Ni nanoparticles. Interfacial reactions, the morphology of the intermetallic compounds (IMC) that were formed, the hardness between the solder joints and the plain Cu/immersion Ag-plated Cu pads depending on the number of the reflow cycles and the aging time have all been investigated. A scallop-shaped Cu6Sn5 IMC layer that adhered to the substrate surface was formed at the interfaces of the plain Sn–Ag–Cu solder joints during the early reflow cycles. A very thin Cu3Sn IMC layer was found between the Cu6Sn5 IMC layer and the substrates after a lengthy reflow cycle and solid-state aging process. However, after adding Ni nanoparticles, a scallop-shaped (Cu, Ni)–Sn IMC layer was clearly observed at both of the substrate surfaces, without any Cu3Sn IMC layer formation. Needle-shaped Ag3Sn and sphere-shaped Cu6Sn5 IMC particles were clearly observed in the β-Sn matrix in the solder-ball region of the plain Sn–Ag–Cu solder joints. Additional fine (Cu, Ni)-Sn IMC particles were found to be homogeneously distributed in the β-Sn matrix of the solder joints containing the Ni nanoparticles. The Sn–Ag–Cu–0.5Ni composite solder joints consistently displayed higher hardness values than the plain Sn–Ag–Cu solder joints for any specific number of reflow cycles–on both substrates–due to their well-controlled, fine network-type microstructures and the homogeneous distribution of fine (Cu, Ni)–Sn IMC particles, which acted as second-phase strengthening mechanisms. The hardness values of Sn–Ag–Cu and Sn–Ag–Cu–0.5Ni on the Cu substrates after one reflow cycle were about 15.1 and 16.6 Hv, respectively–and about 12.2 and 14.4 Hv after sixteen reflow cycles, respectively. However, the hardness values of the plain Sn–Ag–Cu solder joint and solder joint containing 0.5 wt% Ni nanoparticles after one reflow cycle on the immersion Ag plated Cu substrates were about 17.7 and 18.7 Hv, respectively, and about 13.2 and 15.3 Hv after sixteen reflow cycles, respectively.

Effect of 1 wt% ZnO nanoparticles addition on the microstructure, IMC development, and mechanical properties of high Bi content Sn–57.6Bi–0.4Ag solder on Ni metalized Cu pads

In the present study, we investigate the performance of 1 wt% ZnO nanoparticles addition to Sn–57.6Bi–0.4Ag lead-free solder and thereby study the effect of nanoparticle addition on the hardness and the inter-metallic compound (IMC) growth, under different reflow conditions. The interfacial morphology of both the plain Sn–57.6Bi–0.4Ag solder and the composite Sn–57.6Bi–0.4Ag/1 % ZnO solder containing nanoparticles on Ni metalized Cu pads ball grid array substrates and the distribution of nanoparticles on the composite solder were characterized metallographically by using scanning electron microscope (SEM). Prior research efforts by others has found strong evidence that the thickness of the IMC layer increases substantially with the increase in the number of reflow cycles. At the interfaces between solder ball and substrate, scallop-shaped Sn–Ni–Cu IMC layer was found in both the plain solder and the composite solder. Meanwhile the SEM results indicated that the growth of IMC of the composite solder joint was different compared to the plain solder with same number of reflow cycles and reflow time. During the shear test, the shear strength of the composite solder samples containing nanoparticle reinforcement were consistently higher than the plain solder joints due to the fact that the IMC growth has been retarded substantially by the nanoparticle addition. The fracture surface of plain solder exhibited a brittle fracture mode with a relatively smooth surface while doped solder joints showed typical ductile failures with very rough dimpled surfaces.

Effect of Trace Diamond Nanoparticle Addition on the Interfacial, Mechanical, and Damping Properties of Sn-3.0Ag-0.5Cu Solder Alloy

In the present study, small amounts of nanodiamond particles were added to Sn-3.0Ag-0.5Cu eutectic solder to investigate the growth kinetics of the intermetallic compound (IMC) layer at ball grid array pad/solder interfaces. The IMC growth behavior was found to be comparatively slower than that of plain solder joints due to a change in the diffusivity of the constituent atoms and the thermodynamic parameters of elemental affinity. The solder joints containing nanodiamond particles consistently showed higher hardness and strength than plain Sn-3.0Ag-0.5Cu solder joints, after a number of reflow cycles. The hardness of the doped solder was enhanced due to the homogeneous dispersion of nanoparticles, refining IMC phases which act as reinforcements in the solder matrix and as barriers to movement of dislocations. The fracture surface after shear testing of plain solder exhibited a relatively smooth fracture surface, while doped solder joints showed ductile failures with very rough dimpled surfaces. The damping capacity of the doped solder was better than the plain solder at a wide range of temperatures, and the solder with nanoparticle diamond exhibited lower internal friction.

Effect of additions of ZrO 2 nano-particles on the microstructure and shear strength of Sn–Ag–Cu solder on Au/Ni metallized Cu pads

Nano-sized, nonreacting, noncoarsening ZrO 2 particles reinforced Sn–3.0 wt%Ag–0.5 wt%Cu composite solders were prepared by mechanically dispersing ZrO 2 nano-particles into Sn–Ag–Cu solder. The interfacial morphology of unreinforced Sn–Ag–Cu solder and solder joints containing ZrO 2 nano-particles with Au/Ni metallized Cu pads on ball grid array (BGA) substrates and the distribution of reinforcing particles were characterized metallographically. At their interfaces, a Sn–Ni–Cu intermetallic compound (IMC) layer was found in both unreinforced Sn–Ag–Cu and Sn–Ag–Cu solder joints containing ZrO 2 nano-particles and the IMC layer thickness increased with the number of reflow cycles. In the solder ball region, AuSn 4, Ag 3Sn, Cu 6Sn 5 IMC particles and ZrO 2 nano-particles were found to be uniformly distributed in the β-Sn matrix of Sn–Ag–Cu solder joints containing ZrO 2 nano-particles, which resulted in an increase in the shear strength, due to a second phase dispersion strengthening mechanism. The fracture surface of unreinforced Sn–Ag–Cu solder joints exhibited a brittle fracture mode with a smooth surface while Sn–Ag–Cu solder joints containing ZrO 2 nano-particles ductile failure characteristics with rough dimpled surfaces.

The influence of addition of Al nano-particles on the microstructure and shear strength of eutectic Sn–Ag–Cu solder on Au/Ni metallized Cu pads

In order to identify the effect of the addition of Al nano-particles to eutectic Sn–Ag–Cu solder, the interfacial microstructure between the solder and Au/Ni metallized Cu pad ball grid array substrates has been investigated as a function of multiple reflow cycles as well as aging time. Also the strength of the solder joints was evaluated by a ball shear test. In Sn–Ag–Cu solder joints and solder joints containing Al nano-particles, a scallop-shaped Sn–Ni–Cu intermetallic compound layer was clearly observed at the interfaces after long time aging and multiple reflows, and the intermetallic compound layer thickness was substantially increased with an increase in the number of reflow cycles as well as the aging time. However, after the addition of Al nano-particles, an additional Sn–Al–Ag intermetallic compound was found on the top surface of the Sn–Ni–Cu intermetallic compound layer. The Sn–Ag–Cu solder joints containing 3 wt% Al nano-particles consistently displayed a higher shear strength than that of the plain Sn–Ag–Cu solder joints as well as a lower Al nano-particle content as a function of reflow cycles and aging time due to a second phase dispersion strengthening mechanism by the formation of fine Sn–Ag–Al intermetallic compound particles as well as a controlled fine microstructure.

Investigation of small Sn–3.5Ag–0.5Cu additions on the microstructure and properties of Sn–8Zn–3Bi solder on Au/Ni/Cu pads

Abstract The formation of intermetallic compounds and the shear strength of Sn–Zn–Bi solder alloys with various (0, 1, 3, 5 and 7 wt%) weight percentages of Sn–Ag–Cu were investigated on Au/Ni metallized Cu pads depending on the number of reflow cycles. In Sn–Zn–Bi solder joints, scallop-shaped AuZn3 intermetallic compound (IMC) particles were found at the interfaces and in the solder ball regions, fine Bi- and needle-shaped Zn-rich phase were observed in the Sn matrix. After Sn–Ag–Cu additions, an additional Ag–Zn intermetallic compound layer was adhered to the top surface of the AuZn3 layer at the interface and fine spherical-shaped AgZn3 intermetallic compound particles were detected in the solder ball regions together with Bi- and Zn-rich phase volumes. After the addition of Sn–Ag–Cu, the shear strength of Sn–Zn–Bi solder joints increased due to the formation of the fine AgZn3 intermetallic compound particles. The shear strengths of Sn–Zn–Bi and Sn–Zn–Bi/7 wt% Sn–Ag–Cu solder joints after one reflow cycle were about 44.5 and 53.1 MPa, respectively and their shear strengths after eight reflow cycles were about 43.4 and 51.6 MPa, respectively.

Effect of multiple reflow cycles on ball impact responses of Sn‐Ag‐Cu solder joints

PurposeThe purpose of this paper is to report the effect of multiple reflow cycles on ball impact test (BIT) responses and fractographies obtained at an impact velocity of 500 mm/s on Sn‐4Ag‐0.5Cu solder joints.Design/methodology/approachSolder balls were mounted on copper substrate pads with immersion tin surface finish, supplied by two vendors. For these particular test vehicles and test conditions, fracture near the interface between the interfacial Cu6Sn5 intermetallic compound (IMC) and copper pad was identified as the only failure mode induced by BIT.FindingsMeasurement results indicate that BIT characteristics in general degrade as the number of reflow cycles increases. Furthermore, scanning electron microscopy observations show that the thickness and grain size of interfacial Cu6Sn5 increase with increasing number of reflow cycles. This correlation confirms the familiar notion that a thicker Cu6Sn5 degrades the interfacial strength.Originality/valueThere are few reports that can attribute failure directly to the IMC(s) at the interface. This paper, however, successfully correlates the weakening solder joints with the thickening and shape changes of IMC(s) in a direct way.

Effect of small Sn–3.5Ag–0.5Cu additions on the structure and properties of Sn–9Zn solder in ball grid array packages

Sn–9Zn with various additions of Sn–3.5Ag–0.5Cu powder was prepared by mechanically dispersing different weight percentages (1, 3, 5 and 7) of Sn–Ag–Cu powder into Sn–9Zn solder paste. In the Sn–Zn solder, scallop-shaped AuZn 3 intermetallic compound was found at the interfaces. On the other hand, in the Sn–3.5Ag–0.5Cu content solders, an additional ε-AgZn 3 intermetallic compound layer was found to be well adhered on the top surface of the AuZn 3 layer and the ε-AgZn 3 layer thickness increased with the number of reflow cycles. In addition, fine spherical-shaped ε-AgZn 3 intermetallic compound particles as well as an acicular-shaped Zn-rich phase was clearly observed in the β-Sn matrix. On increasing the Sn–Ag–Cu content, the shear load was increased from 1.80 to 2.03 kg after one reflow cycle. In the Sn–3.5Ag–0.5Cu content solders, the fracture surfaces exhibited typical ductile behavior with very rough dimpled surfaces while the fracture surface in the Sn–Zn solder gave fractures with a brittle appearance. In the fracture surface of the Sn–3.5Ag–0.5Cu content solders, some dimples were clearly observed associated with the formation of spherical-shaped ε-AgZn 3 intermetallic compound particles.

Base material selection for reliable lead‐free processing

PurposeTo demonstrate a method of selecting base materials for lead‐free processing based on the kinetics of decomposition.Design/methodology/approachThe paper describes the calculation of Arrhenius kinetic parameters from common “time to delamination” data (T260). Delamination is correlated to a certain conversion into the decomposition reaction. With both of these parameters, various soldering scenarios are analysed.FindingsThe findings highlight the fact that conventional FR‐4 materials are only good for a few reflow cycles. A higher number of reflow cycles can only be fulfilled with RoHS compliant base materials. However, rework and repair may even shift those more thermally resiliant materials over the limit. The peak temperatures are over proportionally responsible for delamination failures and need to be controlled carefully.Originality/valueThe value of the paper lies in its ability to provide guidance on the selection of base materials to comply with various soldering processes. A model has been developed that is able to predict failure limit for a given base material and a given process.

Interfacial reactions between Sn‐based solders and AgPt thick film metallizations on LTCC

PurposeThis paper aims to investigate the metallurgical reactions between two commercial AgPt thick films used as a solder land on a low temperature co‐fired ceramic (LTCC) module and solder materials (SnAgCu, SnInAgCu, and SnPbAg) in typical reflow conditions and to clarify the effect of excessive intermetallic compound (IMC) formation on the reliability of LTCC/printed wiring boards (PWB) assemblies.Design/methodology/approachMetallurgical reactions between liquid solders and AgPt metallizations of LTCC modules were investigated by increasing the number of reflow cycles with different peak temperatures. The microstructures of AgPt metallization/solder interfaces were analyzed using SEM/EDS investigation. In addition, a test LTCC module/PWB assembly with an excess IMC layer within the joints was fabricated and exposed to a temperature cycling test in a −40 to 125°C temperature range. The characteristic lifetime of the test assembly was determined using DC resistance measurements. The failure mechanism of the test assembly was verified using scanning acoustic microscopy and SEM investigation.FindingsThe results showed that the higher peak reflow temperature of common lead‐free solders had a significant effect on the consumption of the original AgPt metallization of LTCC modules. The results also suggested that the excess porosity of the metallization accelerated the degradation of the metallization layer. Finally, the impact of these adverse metallurgical effects on the actual failure mechanism in an LTCC/PWB assembly was demonstrated.Originality/valueThis paper proves how essential it is to know the actual LTCC metallization/solder interactions that occur during reflow soldering and to recognize their effect on solder joint reliability in LTCC module/PWB assemblies. Moreover, the adverse effect of using lead‐free solders on the degradation of Ag‐based metallizations and, consequently, on board level reliability is demonstrated. Finally, practical guidelines for selecting materials for second‐level solder interconnections of LTCC module are given.

Multiple reflow study of ball grid array (BGA) solder joints on Au/Ni metallization

This paper evaluates the shearing behavior of ball grid array (BGA) solder joints on Au/Ni/Cu pads of FR4 substrates after multiple reflow soldering. A new Pb-free solder, Sn–3Ag–0.5Cu–8In (SACI), has been compared with Sn–3Ag–0.5Cu (SAC) and Sn–37Pb (SP) solders, in terms of fracture surfaces, shearing forces and microstructures. Three failure modes, ball cut, a combination of solder shear and solder/pad bond separation, and pad lift, are assessed for the different solders and reflow cycles. It is found that the shearing forces of the SP and SAC solder joints tend to increase slightly with an increase in the number of reflow cycles due to diffusion-induced solid solution strengthening of the bulk solder and augmentation of the shearing area. However, the shearing forces of the SACI solder joints decrease slightly after four cycles of reflow, which is ascribed to the thermal degradation of both the solder/intermetallic compound (IMC) and IMC/Ni interfaces. The SACI solder joints yield the highest strengths, whereas the SP solder joints give the smallest values, irrespective of the number of reflow cycles. Thickening of the interfacial IMC layer and coarsening of the dispersing IMC particles within the bulk solders were also observed. Nevertheless, the variation of shearing forces and IMC thickness with different numbers of reflow cycles was not so significant since the Ni under layer acted as an effective diffusion barrier. In addition, the initially-formed IMC layer retarded the further extensive dissolution of the pad material and its interaction with the solder.

Effect of multiple reflows on mechanical strength of the interface formed between Sn–Zn–Bi solder and Au/Ni/Cu bond pad

In this work, the shear strengths and interfacial reactions of Sn–8Zn–3Bi and Sn–8Zn–1Bi (wt%) solders with Au/Ni/Cu ball grid array (BGA) pad metallization were systematically investigated after multiple reflows. The peak reflow temperature was fixed at 230 °C. After the shear test, fracture surfaces were investigated using a scanning electron microscope equipped with an energy dispersive x-ray spectrometer. Cross-sectional studies of the interfaces were also conducted to correlate with the fracture surfaces. Two failure modes, ball cut and pad lift, were assessed for the different solders and reflow cycles. It was found that the shearing forces of both the Sn–Zn–Bi solder joints tended to increase slightly with an increase in the number of reflow cycles due to augmentation of the shearing area. A layer-type spalling of the interfacial intermetallic compounds (IMCs) was observed very early in the liquid-state reaction for the solder alloys. The active nature of the Zn confirmed an instant reaction zone at the interface to maintain the bonding between the solder and the substrate.

Intermetallic compound formation and solderability for immersion tin

PurposeTo investigate the relationship between intermetallic compound (IMC) formation and solderability for immersion tin deposit under different number of reflows.Design/methodology/approachScanning Auger microscopy and X‐ray photoelectron spectrometer surface analysis techniques were used to study changes in immersion tin deposit layer when subjected to simulated solder reflow conditions.FindingsAuger analysis also showed that no three discrete uniform layers of pure tin, Cu6Sn5η‐phase and Cu3Sn ε‐phase can be observed after one reflow. Degradation in solderability performance after reflow was due to the formation of a Cu6Sn5 IMC at the surface. This IMC has inferior solder wetting properties compared to tin. As the number of reflow cycles increases the surface contains less tin rich regions and more IMC regions. Experiments showed that longer reflow times during the assembly process or use of a thicker tin layer can improve the solderability after three reflow cycles.Research limitations/implicationsThis work has shown that longer reflow times during the assembly process or use of a thicker tin layer can improve solderability after three reflow cycles. These two approaches are thus recommended when using immersion tin finishes on PCBs that require multiple lead‐free reflow cycles.Originality/valueThis paper provides valuable data that will assist PCB assemblers to optimise their solder reflow conditions when assembling boards that require multiple solder cycles.

The compatibility of epoxy‐based printed circuit boards with lead‐free assembly

PurposeAims to explain the main requirements for printed circuit boards (PCBs) and to determine the survival rate of boards in lead‐free assembly.Design/methodology/approachThe first two main requirements are the survival of 5‐6 cycles lead free reflow with peak temperatures of up to 260°C and an identical or even better board reliability of such boards compared to todays eutectic soldered ones. In a first series of tests the influence of base materials, reflow temperature gradient and peak temperature on PCB survival rate are investigated. Thermo‐mechanical data of different epoxy‐based materials are compared to survival rate investigations using repeated reflow tests. The impact of PCB manufacturing and design on the lead free performance is discussed. A second series of investigations is air‐to‐air life cycle tests of daisy chain boards out of different epoxy‐based materials with varying preconditioning were done.FindingsThe tests showed that dicy cured epoxy base materials are not able to withstand the thermal stress of the mentioned soldering steps. Board design and the heating gradient in reflow also influence the assembly performance. Thermal cycling tests (air‐to‐air), showed clearly the effect of reflow temperature and number of reflow cycles on through‐hole reliability. There was no significant impact of z‐axis‐expansion on the through‐hole failure rate in air‐to‐air cycling.Originality/valueProvides further information on the lead‐free assembly of PCBs.

The influence of multiple reflow cycles on solder joint voids for lead‐free PBGAs

Lead‐free soldering is becoming a common practice in the electronics industry because of the growing general opposition to lead‐containing solders. The reliability of lead‐free solders has been studied a lot recently, but knowledge of it is still incomplete and many issues related to them are under heavy debate. This paper presents results from a study of the formation of voids with regard to the number of reflow cycles in three different kinds of solder joints: first the ones prepared with lead‐free solder paste and lead‐free plastic ball grid array (PBGA) components, next the ones prepared with lead‐free solder paste and tin‐lead‐silver PBGA components, and last the ones prepared with tin‐lead solder paste and tin‐lead‐silver PBGA components.