Nonvolatile Resistive Memory Devices Research Articles

Exploring the Influence of Copper Chemical Displacement Duration on Nonvolatile Oxide-based Resistive Memory Device Characteristics

Exploring the Influence of Copper Chemical Displacement Duration on Nonvolatile Oxide-based Resistive Memory Device Characteristics

Ferroelectric polarization and conductance filament coupling for large window and high-reliability resistive memory and energy-efficient synaptic devices

Ferroelectric capacitors hold great promise for non-volatile memory applications. However, the challenge lies in fabricating resistive switching devices with a high on/off ratio, excellent non-volatility, and a simple manufacturing process. Here, a novel approach is introduced by demonstrating the efficacy of the coupling effect between ferroelectric polarization and oxygen vacancy-based conductive filaments in Hf0.5Zr0.5O2 (HZO) films for the creation of non-volatile resistive switching memory devices, achieving an impressive on/off ratio of 6.8 × 103 at +1.8 V. An in-depth exploration of the resistive switching mechanism is provided and subsequently the outstanding durability and retention characteristics of these devices for resistive switching is validated. Furthermore, the device’s capacity to emulate non-volatile synaptic functionalities is assessed. Our results reveal that under pulsed conditions of 1 V/–2 V with 1 µs pulses spaced 50 ms apart, the device can robustly achieve potentiation/depression synaptic plasticity, while exhibiting energy consumption (0.16 fJ for potentiation, 0.12 fJ for depression) reduced by 1–2 orders of magnitude compared to biological synapses. This work holds significant value as a reference for the fabrication of energy-efficient, non-volatile memory and synaptic devices.

Highly Flexible Non-Volatile Resistive Memory Devices Based on ZnO Nanoparticle/Graphene Heterostructures Embedded in Poly(methyl methacrylate)

Highly Flexible Non-Volatile Resistive Memory Devices Based on ZnO Nanoparticle/Graphene Heterostructures Embedded in Poly(methyl methacrylate)

Memory device based on a nano-granulars and nano-worms structured MoS2 active layer: The origin of resistive switching characteristics

This study systematically demonstrates resistive switching (RS) functionality of MoS2 nanostructured [nano-granulars (NGs) and nano-worms (NWs)] based non-volatile resistive random access memory (ReRAM) device. Interestingly, the SET and RESET voltage sharply changes from NGs to NWs device. The RS behavior of devices is interpreted by proposing and discussing a model. In the Ag/MoS2(NGs)/ITO device, a high resistance state (HRS) and low resistance state (LRS) could be ascribed due to the formation/disruption of conducting filament via trapping-detrapping of electrons across the NGs active layer. In contrast, the RS behavior of Ag/MoS2(NWs)/ITO device is caused by forming of an Ag metallic filamentary route between the electrodes. The NWs structured device show substantially better endurance and homogeneity than the device with an NGs structure. This nanostructural-dependent device functionality allows extended RS properties and establishes a relationship between the material's nano-level structural and electrical features.

Near room temperature multilevel resistive switching memory with thin film ionic liquid crystals

Multilevel operation of nonvolatile resistive random-access memory devices was demonstrated using thin films of an ionic liquid crystal, 1-dodecyl-3-methylimidazolium tetrafluoroborate ([C12mim][BF4]), as a resistive switching layer.

In-memory analog solution of compressed sensing recovery in one step

Modern analog computing, by gaining momentum from nonvolatile resistive memory devices, deals with matrix computations. In-memory analog computing has been demonstrated for solving some basic but ordinary matrix problems in one step. Among the more complicated matrix problems, compressed sensing (CS) is a prominent example, whose recovery algorithms feature high-order matrix operations and hardware-unfriendly nonlinear functions. In light of the local competitive algorithm (LCA), here, we present a closed-loop, continuous-time resistive memory circuit for solving CS recovery in one step. Recovery of one-dimensional (1D) sparse signal and 2D compressive images has been experimentally demonstrated, showing elapsed times around few microseconds and normalized mean squared errors of 10 −2 . The LCA circuit is one or two orders of magnitude faster than conventional digital approaches. It also substantially outperforms other (electronic or exotically photonic) analog CS recovery methods in terms of speed, energy, and fidelity, thus representing a highly promising technology for real-time CS applications.

Controlled Synthesis of Lead-Free Double Perovskite Colloidal Nanocrystals for Nonvolatile Resistive Memory Devices.

Although lead-free double perovskites such as Cs2AgBiBr6 have been widely explored, they still remain a daunting challenge for the controlled synthesis of lead-free double perovskite nanocrystals with highly tunable morphology and band structure. Here, we report the controlled synthesis of lead-free double perovskite colloidal nanocrystals including Cs2AgBiBr6 and Cs2AgInxBi1-xBr6 via a facile wet-chemical synthesis method for the fabrication of high-performance nonvolatile resistive memory devices. Cs2AgBiBr6 colloidal nanocrystals with well-defined cuboidal, hexagonal, and triangular morphologies are synthesized through a facile wet-chemical approach by tuning the reaction temperature from 150 to 190 °C. Further incorporating indium into Cs2AgBiBr6 to synthesize alloyed Cs2AgInxBi1-xBr6 nanocrystals not only can induce the indirect-to-direct bandgap transition with enhanced photoluminescence but also can improve its structural stability. After optimizing the active layers and device structure, the fabricated Ag/polymethylene acrylate@Cs2AgIn0.25Bi0.75Br6/ITO resistive memory device exhibits a low power consumption (the operating voltage is ∼0.17 V), excellent cycling stability (>10 000 cycles), and good synaptic property. Our study would enable the facile wet-chemical synthesis of lead-free double perovskite colloidal nanocrystals in a highly controllable manner for the development of high-performance resistive memory devices.

Ionic Liquid Crystal Thin Film as Switching Layer in Nonvolatile Resistive Memory.

In this study, we propose the use of an ionic liquid crystal (ILC) as a new resistive switching layer in nonvolatile resistive random-access memory (ReRAM) devices. The high-quality vacuum-deposited ILC films of 1-hexadecyl-3-methylimidazolium hexafluorophosphate ([C16mim][PF6]) enabled to demonstrate the first operation of ReRAM devices with a low set voltage of ∼1 V and stable switching behavior for up to ∼44 cycles. The key to the successful operation is that the ILC layer is in the liquid crystal phase (smectic A), where the electric double layers formed at the electrode-ILC interfaces play a significant role. The results of basic electrical properties and I-V curve fittings suggested the following operation principle: the formation and rupture of charge-composed filaments within the ILC film, where the current conduction is primarily governed by the trap charge limited current (TCLC) mechanism. These achievements will pave the way for advanced studies of ILC-based electronic devices.

Vanadium oxide thin film deposited on Si by atomic layer deposition for non-volatile resistive switching memory devices

Vanadium dioxide (VO2) is a representative metal–insulator-transition (MIT) material that undergoes a reversible phase transition at 68 °C, which is close to room temperature. This shows the bias-triggered volatile resistance changes driven by MIT so that many studies have been made to implant VO2 as selectors for solving the sneak current problem of resistive random-access memory (ReRAM). However, the non-volatile switching of VO2 for non-volatile memory (NVM) application has not been demonstrated yet but if realized, this is truly breakthrough for low power and ultrafast NVM application. Herein, we report a successful formation of multiphase vanadium oxide on Si wafer via atomic layer deposition followed by a post-deposition annealing (PDA) process and demonstrate its applicability as a NVM device. It was confirmed that the multiphase vanadium oxide has MIT-driven abrupt resistance switching (i.e., low- and high-resistance state) at ± 1.6 V due to increased oxygen vacancies responsible for non-volatile memory property. The alternating current (AC) endurance upto 30,000 cycles and charge retention upto 3,000 sec are achieved at 2ⅹ102 of LRS/HRS current ratio. As a result, it opens the possibility of application to next-generation memory devices by reliable non-volatile MIT switching scheme.

Perforated Turbostratic Graphene As Active Layer in a Nonvolatile Resistive Switching Memory Device

Perforated turbostratic graphene (PTG) sheets have been synthesized from a natural waste material, dead bougainvillea bracts, using a single-step pyrolysis method, and a resistive switching (RS) memory device has been constructed with it for the very first time. Herein, the edges of these large-area multilayer graphene sheets are highly conducting due to the turbostratic stacking between the adjacent layers of the graphene sheets. These highly conducting PTG sheets embedded inside an insulating polymer matrix can act as an active layer for resistive switching memory devices. This hybrid structure shows nonlinear resistance change between two distinct resistance states by simple bias voltage variation. The trap-assisted space-charge-limited conduction can realize the high resistive state (HRS), whereas the low resistive state (LRS) takes place through direct conduction. To achieve the best performing device, a number of optimizations have been performed, like the variation of polymer matrices, variation of PTG and polymer concentration, active layer thickness variation, and top electrode area variation. The best performing device showed reproducibility of current–voltage data (>200 cycles), low power consumption (SET voltage <1 V), a high ON/OFF ratio (>104), a long retention time (>104 s), and a large number of endurance cycles (>103). High writing-read-erase-read speed and flexibility/bending cycle tests were also carried out on the best-performing device to examine its tenacity. The current PTG-based flexible RS memory device derived from a biowaste, dead bougainvillea bracts, can provide an important step toward developing green electronics.

Memory characteristics of anthracene-based polyimides in non-volatile resistive memory devices

Two anthracene-containing polyimides were synthesized and compared as an active layer in non-volatile resistive memory devices. The 6FDA-AMDA PI-based devices showed WORM behavior with an on/off ratio of up to 106 and a high device yield of 80%.

Design and synthesis of a solution-processed redox-active bis(formazanate) zinc complex for resistive switching applications.

In this paper, we report the synthesis and characterization of a mononuclear zinc complex (1) containing a redox-active bis(4-antipyrinyl) derivative of the 3-cyanoformazanate ligand. Complex 1 was readily obtained by refluxing zinc acetate with 3-cyano-1,5-(4-antipyrinyl)formazan (LH) in a methanolic solution. Single-crystal X-ray diffraction analysis of complex 1 shows that the formazanate ligands bind to the zinc center in a five-member chelate "open" form via the 1- and 4-positions of the 1,2,4,5-tetraazapentadienyl formazanate backbone leading to the formation of the mononuclear bis(formazanate) zinc complex exhibiting a distorted octahedral geometry. We also report the study of resistive-switching random access memory application of this solution-processable bis(formazanate) Zn(II) complex to facilitate the practical implementation of transition metal complex-based molecular memory devices. The complex demonstrated high conductance switching with a large ON-OFF ratio, good stability, and a long retention time. A trap-controlled space charge limited current mechanism is proposed for the observed resistive switching behavior of the device, wherein the role played by the [ZnIIL2] complex that comprises the extended redox-active conjugated ligand backbone is revealed by corroborating electrochemical studies, spectrochemical experiments, and DFT calculations. In addition to providing significant insights into the molecular design of transition metal complexes for memory applications, this study also presents the utilization of ZnIIL2 towards the realization of non-volatile resistive random access memory (RRAM) devices with inorganic/organic hybrid active layers that are highly cost-effective and sustainable. These devices exhibited multilevel switching and low current operation, both of which are desirable for advanced memory applications.

Reversible electrical percolation in a stretchable and self-healable silver-gradient nanocomposite bilayer

The reversibly stable formation and rupture processes of electrical percolative pathways in organic and inorganic insulating materials are essential prerequisites for operating non-volatile resistive memory devices. However, such resistive switching has not yet been reported for dynamically cross-linked polymers capable of intrinsic stretchability and self-healing. This is attributable to the uncontrollable interplay between the conducting filler and the polymer. Herein, we present the development of the self-healing, stretchable, and reconfigurable resistive random-access memory. The device was fabricated via the self-assembly of a silver-gradient nanocomposite bilayer which is capable of easily forming the metal-insulator-metal structure. To realize stable resistive switching in dynamic molecular networks, our device features the following properties: i) self-reconstruction of nanoscale conducting fillers in dynamic hydrogen bonding for self-healing and reconfiguration and ii) stronger interaction among the conducting fillers than with polymers for the formation of robust percolation paths. Based on these unique features, we successfully demonstrated stable data storage of cardiac signals, damage-reliable memory triggering system using a triboelectric energy-harvesting device, and touch sensing via pressure-induced resistive switching.

Preparation and incorporation of NiSe@MoSe2 nano arrays in PVA matrix for resistive switching memory

In the present work, we have synthesized Nickel selenide@Molybdenum diselenide (NiSe@MoSe2) heteronanostructured arrays by a one-step hydrothermal method. The structural and optical analysis of nanopowder is done through Field emission scanning electron microscopy (FESEM), elemental mapping, Energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), UV–vis, and Photoluminescence (PL) spectroscopy. XRD reveals the formation of a hexagonal structured system with a crystallite size of 166 nm. The bandgap of NiSe@MoSe2 nanosheets is found to be 1.71 eV, calculated from UV–vis spectra. FESEM showed the homogenous growth of NiSe@MoSe2 nanosheets while electronic transitions are investigated through PL. Further, the polymer nanocomposites of NiSe@MoSe2/PVA are synthesized by the ex-situ method at six different NiSe@MoSe2 concentrations in the PVA matrix. XRD shows good interaction between NiSe@MoSe2 and PVA polymer. The crystallinity increases as concentrations of NiSe@MoSe2 in PVA increases. FESEM shows the uniform distribution of NiSe@MoSe2 nanosheets in the PVA matrix. The two-terminal Ag/NiSe@MoSe2-PVA/FTO devices have been fabricated and characterized electrically by I-V measurements. I-V shows hysteresis behavior and also, bipolar switching is observed with a maximum Ion/Ioff ratio of ~103 at 2 wt. % NiSe@MoSe2 concentration in the PVA matrix. The good stability and reliability are checked through endurance and write-read-erase-read cyclic sequences. The obtained results open up the possibility of a next-generation non-volatile resistive switching memory device.

Highly Flexible and Asymmetric Hexagonal‐Shaped Crystalline Structured Germanium Dioxide‐Based Multistate Resistive Switching Memory Device for Data Storage and Neuromorphic Computing

AbstractWith the increase of big data and artificial intelligence (AI) applications, fast and energy‐efficient computing is critical in future electronics. Fortunately, nonvolatile resistive memory devices can be potential candidates for these issues due to their in‐computing and neuromorphic computational abilities. Hence, the paper proposes a highly flexible and asymmetric hexagonal‐shaped crystalline structured germanium dioxide‐based Ag/GeO2/ITO device for high data storage and neuromorphic computing. The proposed device shows the highly asymmetric memristor behavior at low operating voltage to block backward current. The operational behaviors are observed by modulating the applied amplitude, current compliance, and varying the frequency, which shows excellent stability and repeatability in electrical characterizations. Furthermore, the neuromorphic device exhibits synaptic learning properties such as potentiation‐depression, pulse amplification, and spike time‐dependent plasticity rules (STDP). Here, the weights update of the memristive synaptic device is analyzed using a multilayer perceptron convolutional neural network (CNN) by optimizing the learning rate, training epochs, and algorithm to achieve higher accuracy for pattern recognition using CIFAR‐10 data. Undoubtedly, the demonstrated results suggest that the proposed device is a promising candidate to develop high‐density storage and neuromorphic computing technology for wearable and AI electronics.

Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing

Smart material implication (SIMPLY) logic has been recently proposed for the design of energy-efficient Logic-in-Memory (LIM) architectures based on non-volatile resistive memory devices. The SIMPLY logic is enabled by adding a comparator to the conventional IMPLY scheme. This allows performing a preliminary READ operation and hence the SET operation only in the case it is actually required. This work explores the SIMPLY logic scheme using nanoscale spin-transfer torque magnetic tunnel junction (STT-MTJ) devices. The performance of the STT-MTJ based SIMPLY architecture is analyzed by varying the load resistor and applied voltages to implement both READ and SET operations, while also investigating the effect of temperature on circuit operation. Obtained results show an existing tradeoff between error rate and energy consumption, which can be effectively managed by properly setting the values of load resistor and applied voltages. In addition, our analysis proves that tracking the temperature dependence of the MTJ properties through a proportional to absolute temperature (PTAT) reference voltage at the input of the comparator is beneficial to mitigate the reliability degradation under temperature variations.

Laser-induced graphene-based miniaturized, flexible, non-volatile resistive switching memory devices

Laser-induced graphene-based miniaturized, flexible, non-volatile resistive switching memory devices

Oscillatory Circuits With a Real Non-Volatile Stanford Memristor Model

Stanford memristor model is a widely used model that accurately characterizes real non-volatile metal-oxide resistive random access memory (RRAM) devices with bipolar switching characteristics. The paper studies for the first time the dynamics and bifurcations in a class of nonlinear oscillators with <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">real non-volatile memristor devices</i> obeying Stanford model. This is in contrast with papers in the literature considering oscillators with ideal, abstract, or artificial memristor models, that are unable to describe physical memristors implemented in nanotechnology. One main new idea in the paper is to use the memristor as a <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">programmable nonlinear resistor</i> . Namely, two principal modes of operation are considered. 1) Analogue transient phase: the oscillator is designed so that in the transient oscillations the voltage on the memristor is below threshold, hence the main memristor state variable, i.e., the gap of the insulating material, is almost constant and the memristor behaves as a static nonlinear resistor. 2) Programming phase: the nonlinear characteristic of the memristor, which depends on the gap, can be changed via the application of voltages above threshold. The paper studies nonlinear oscillations in the transient phase for a fixed gap as well as the bifurcations phenomena displayed when the gap is varied. The paper also discusses the differences between the approach in the paper and those to design other memristor oscillators with non-volatile memristors.

Low-Frequency 1/f Noise Characteristics of Ultra-Thin AlOx-Based Resistive Switching Memory Devices with Magneto-Resistive Responses

Low-frequency 1/f voltage noise has been employed to probe stochastic charge dynamics in AlOx-based non-volatile resistive memory devices exhibiting both resistive switching (RS) and magneto-resistive (MR) effects. A 1/fγ noise power spectral density is observed in a wide range of applied voltage biases. By analyzing the experimental data within the framework of Hooge’s empirical relation, we found that the Hooge’s parameter α and the exponent γ exhibit a distinct variation upon the resistance transition from the low resistance state (LRS) to the high resistance state (HRS), providing strong evidence that the electron trapping/de-trapping process, along with the electric field-driven oxygen vacancy migration in the AlOx barrier, plays an essential role in the charge transport dynamics of AlOx-based RS memory devices.

Polymer-based non-volatile resistive random-access memory device fabrication with multi-level switching and negative differential resistance state

Resistive random-access memory (RRAM) has been widely considered for its prospective applicability owing to its non-volatile characteristics. In this study, a polymer-based vacuum-free RRAM device fabricated with the conductive polymer, poly(3,4-ethylene-dioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) was proposed. Pristine PEDOT:PSS coated on indium tin oxide (ITO) electrode was used as the active layer, while PEDOT:PSS with 16 vol% ethylene glycol was added for the top electrode. The PEDOT:PSS-based RRAM device demonstrated controlled non-volatile bipolar switching and a good ON/OFF ratio with a negative differential resistance effect in the high-voltage range during the RESET process. Multi-level switching was also accomplished by controlling the voltage, which demonstrated reliable and non-volatile switching. The switching mechanism of this polymer RRAM device can be explained through the electrochemical filamentary formation as well as the current-induced phase segregation of PEDOT:PSS near the anode(ITO)/polymer interface. • Vacuum-free and solution-processed fabrication method of a polymer based RRAM device. • Low cost and low temperature (<120 °C) fabrication. • MLC switching during SET process and NDR effect during RSEST process. • Investigation of detailed switching mechanism from literature survey and I–V curve fitting.