AbstractSurface leakage currents are one of the many causes of dark current exhibited by semiconductor devices and are a common limiting factor to device performance for many types of devices. Traditionally, these surface leakage currents are controlled through the post‐epitaxial insertion of a surface passivation layer, but surface passivation is often expensive, time consuming, and not entirely effective. Unipolar barriers may be incorporated into electronic devices as a less expensive and more effective alternative way to control surface leakage currents. Unipolar barrier devices are demonstrated here using MBE‐grown InAs nBn detectors and unipolar barrier photodiodes. A commercial InAs photodiode becomes surface leakage current limited at 220 K while the nBn detector shows no surface leakage current down to at least 135 K. The unipolar barrier photodiode shows no detectable surface leakage down to at least 130 K while a matching conventional photodiode is limited by surface conduction at a temperature of 150 K. This indicates the greatly improved performance of the unipolar barrier devices (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)