The rise of Artificial Intelligence has led to an increased demand for computing hardware which can handle data intensive tasks in an energy efficient manner. Compute-in-memory architecture which combines information processing and data storage at the same location and specializes in Multiply-and-Accumulate (MAC) operation has emerged as an attractive candidate to meet this demand. Non-volatile capacitive (nvCAP) devices are investigated to realize the synaptic devices to enable CIM in charge-domain-computing. Charge-domain-CIM works as follows: The synaptic weights of a neural network are stored as the capacitance state of the nvCAP device in a crossbar array. The input of the neural network is applied as voltages to the crossbar array, and the resulting charges are summed up as the MAC operation. The nvCAP synaptic devices also provides benefits over traditional resistive synapses such as: only static power consumption, negligible sneaky current, suppressed read-disturb due to small-signal-read out. Recently, the Ferroelectric Field Effect Transistor (FeFET) has been demonstrated to operate in nvCAP mode, with S-D terminal of the FET shorted and Body-Floating. Here, the Field Effect Transistor part exhibits a gate voltage-dependent capacitance behavior, where the high capacitance originates from the transistor gate area, while the low capacitance originates from the overlap region between the gate oxide and source-drain region of FET. The ferroelectric layer part introduces a lateral shift in the C-V curve of FET, leading to either a high (CON) or low capacitance (COFF) state at 0V that can be tuned by an applied electric field. The CON/COFF ratio of the device can be designed as-per the application by increasing the channel area and reducing the overlap length. For a robust and consistent performance in CIM, reliability aspects of ferroelectric nvCAP are investigated. The FeFET in nvCAP mode demonstrates an initial endurance of 106 Program-Erase cycles while maintaining the ON/OFF >5. It is found that a CV sweep performed on the device help recover the performance. By performing repeated endurance-recovery operation, a recovered endurance of 108 cycles is achieved. The nvCAP device demonstrates memory retention of at least 1 day @85C for all fresh, fatigued and recovered states of the device. The nvCAP device also shows multi-level-cell capabilities for atleast 4 levels by changing the Program voltages. Figure 1
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